Bernhard Ruch
Orcid: 0000-0003-1243-217X
According to our database1,
Bernhard Ruch
authored at least 2 papers
between 2020 and 2025.
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Bibliography
2025
Evidence for 2D Hole Gas in GaN Gate Injection Transistors and its Role in RDson Recovery.
Proceedings of the IEEE International Reliability Physics Symposium, 2025
2020
Generation of Hot-Carrier Induced Border and Interface Traps, Investigated by Spectroscopic Charge Pumping.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020