Bernhard Ruch

Orcid: 0000-0003-1243-217X

According to our database1, Bernhard Ruch authored at least 2 papers between 2020 and 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2025
Evidence for 2D Hole Gas in GaN Gate Injection Transistors and its Role in RDson Recovery.
Proceedings of the IEEE International Reliability Physics Symposium, 2025

2020
Generation of Hot-Carrier Induced Border and Interface Traps, Investigated by Spectroscopic Charge Pumping.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020


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