Christian Schleich
Orcid: 0000-0002-8832-520X
According to our database1,
Christian Schleich
authored at least 2 papers
in 2020.
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Bibliography
2020
Generation of Hot-Carrier Induced Border and Interface Traps, Investigated by Spectroscopic Charge Pumping.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020