Christian Schleich

According to our database, Christian Schleich authored at least 2 papers in 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2020

Generation of Hot-Carrier Induced Border and Interface Traps, Investigated by Spectroscopic Charge Pumping.

Bernhard Ruch, Gregor Pobegen, Christian Schleich, Tibor Grasser

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Similarities and Differences of BTI in SiC and Si Power MOSFETs.

Judith Berens, Magdalena Weger, Gregor Pobegen, Thomas Aichinger, Gerald Rescher, Christian Schleich, Tibor Grasser

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020