Chang Xue
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Bibliography
2022
Single-Mode CMOS 6T-SRAM Macros With Keeper-Loading-Free Peripherals and Row-Separate Dynamic Body Bias Achieving 2.53fW/bit Leakage for AIoT Sensing Platforms.
Proceedings of the IEEE International Solid-State Circuits Conference, 2022
Reliability-Improved Read Circuit and Self-Terminating Write Circuit for STT-MRAM in 16 nm FinFET.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022