Chen-Shiun Lee

According to our database, Chen-Shiun Lee authored at least 4 papers between 2019 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Wafer Defect Pattern Classification with Explainable-Decision Tree Technique.

Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Sying-Jyan Wang, Andrew Yi-Ann Huang, Chen-Shiun Lee, Leon Li-Yang Chen, Peter Yi-Yu Liao, Nova Cheng-Yen Tsai

Proceedings of the IEEE International Test Conference, 2022

2020

TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning.

Leon Li-Yang Chen, Katherine Shu-Min Li, Ken Chau-Cheung Cheng, Sying-Jyan Wang, Andrew Yi-Ann Huang, Leon Chou, Nova Cheng-Yen Tsai, Chen-Shiun Lee

Proceedings of the IEEE International Test Conference, 2020

Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis.

Ken Chau-Cheung Cheng, Katherine Shu-Min Li, Andrew Yi-Ann Huang, Ji-Wei Li, Leon Li-Yang Chen, Nova Cheng-Yen Tsai, Sying-Jyan Wang, Chen-Shiun Lee, Leon Chou, Peter Yi-Yu Liao, Hsing-Chung Liang, Jwu E. Chen

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

2019

TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning.

Andrew Yi-Ann Huang, Katherine Shu-Min Li, Cheng-Yen Tsai, Ken Chau-Cheung Cheng, Sying-Jyan Wang, Xu-Hao Jiang, Leon Chou, Chen-Shiun Lee

Proceedings of the IEEE International Test Conference, 2019