Ji-Wei Li

According to our database1, Ji-Wei Li authored at least 1 paper in 2020.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2020
Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis.
Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020


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