Chennian Di

According to our database1, Chennian Di authored at least 8 papers between 1992 and 2017.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2017
Adapting an industrial memory BIST solution for testing CAMs.
Proceedings of the International Test Conference in Asia, 2017

1996
An efficient CMOS bridging fault simulator: with SPICE accuracy.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1996

1994
Probability Analysis for CMOS Floating Gate Faults.
Proceedings of the EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28, 1994

1993
On CMOS bridge fault modeling and test pattern evaluation.
Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993

On Accurate Modeling and Efficient Simulation of CMOS Opens.
Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

A net-oriented method for realistic fault analysis.
Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993

Fast Multi-Layer Critical Area Computation.
Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, 1993

1992
IC defect sensitivity for footprint-type spot defects.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992


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