Richard Wong

According to our database, Richard Wong authored at least 37 papers between 1998 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Dynamic access control method for SDP-based network environments.

Hyunjin You, Doochan Ko, Daniel Kim, Richard Wong, Inwhee Joe

EURASIP J. Wirel. Commun. Netw., December, 2023

2020

A Distributed Testbed for 5G Scenarios: An Experimental Study.

Mohammad Kazem Chamran, Kok-Lim Alvin Yau, Rafidah Md. Noor, Richard Wong

Sensors, 2020

2019

A Fully Integrated Digital LDO With Built-In Adaptive Sampling and Active Voltage Positioning Using a Beat-Frequency Quantizer.

Somnath Kundu, Muqing Liu, Shi-Jie Wen, Richard Wong, Chris H. Kim

IEEE J. Solid State Circuits, 2019

Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology.

Lyuan Xu, Jingchen Cao, Bharat L. Bhuva, Indranil Chatterjee, Shi-Jie Wen, Richard Wong, Lloyd W. Massengill

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies.

Jingchen Cao, Lyuan Xu, Bharat L. Bhuva, Shi-Jie Wen, Richard Wong, Balaji Narasimham, Lloyd W. Massengill

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Study of proton radiation effect to row hammer fault in DDR4 SDRAMs.

Chul Seung Lim, Kyungbae Park, GeunYong Bak, Donghyuk Yun, Myungsang Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong

Microelectron. Reliab., 2018

Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree.

Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong

Microelectron. Reliab., 2018

A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning.

Somnath Kundu, Muqing Liu, Richard Wong, Shi-Jie Wen, Chris H. Kim

Proceedings of the 2018 IEEE International Solid-State Circuits Conference, 2018

Single-event effects on optical transceiver.

Kurt J. Lezon, Shi-Jie Wen, Y.-F. Dan, Richard Wong, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

BPPT - Bulk potential protection technique for hardened sequentials.

Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

IZIP: In-place zero overhead interconnect protection via PIP redundancy.

Yi Luo, Adrian Evans, Shi-Jie Wen, Rick Wong, GengSheng Chen

Proceedings of the 12th IEEE International Conference on ASIC, 2017

2016

Rectifeye: a vision-correcting system for virtual reality.

Pierre-Yves Laffont, Tobias Martin, Markus H. Gross, Wei De Tan, C. T. Lim, Affa Au, Rick Wong

Proceedings of the SIGGRAPH ASIA 2016, Macao, December 5-8, 2016 - VR Showcase, 2016

NBTI Lifetime Evaluation and Extension in Instruction Caches.

Shengyu Duan, Basel Halak, Rick Wong, Mark Zwolinski

Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, 2016

2015

New insights into the impact of SEUs in FPGA CRAMs.

Sheng Wang, Adrian Evans, Shi-Jie Wen, Rick Wong, GengSheng Chen

IEICE Electron. Express, 2015

Terrestrial SER characterization for nanoscale technologies: A comparative study.

Nihaar N. Mahatme, Bharat L. Bhuva, Nelson J. Gaspard, T. Assis, Y. Xu, P. Marcoux, M. Vilchis, Balaji Narasimham, A. Shih, Shi-Jie Wen, Rick Wong, N. Tam, M. Shroff, S. Koyoma, A. Oates

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Analysis of advanced circuits for SET measurement.

Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams.

GeunYong Bak, Soonyoung Lee, Hosung Lee, Kyungbae Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Charlie Slayman

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Single Event Resilient Dynamic Logic Designs.

Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi

J. Electron. Test., 2014

Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser.

Yi Ren, Anlin He, Shuting Shi, Gang Guo, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Bharat L. Bhuva

J. Electron. Test., 2014

New approaches for synthesis of redundant combinatorial logic for selective fault tolerance.

Hao Xie, Li Chen, Rui Liu, Adrian Evans, Dan Alexandrescu, Shi-Jie Wen, Rick Wong

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

2013

Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication.

Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong

Microprocess. Microsystems, 2013

Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller.

Yi Ren, Shuting Shi, Li Chen, Haibin Wang, L.-J. Gao, Gang Guo, Shi-Jie Wen, Richard Wong, N. W. van Vonno

J. Electron. Test., 2013

Synthesis of Redundant Combinatorial Logic for Selective Fault Tolerance.

Hao Xie, Li Chen, Adrian Evans, Shi-Jie Wen, Rick Wong

Proceedings of the IEEE 19th Pacific Rim International Symposium on Dependable Computing, 2013

Placement of repair circuits for in-field FPGA repair.

Michael J. Wirthlin, Joshua E. Jensen, Alex Wilson, William Howes, Shi-Jie Wen, Rick Wong

Proceedings of the 2013 ACM/SIGDA International Symposium on Field Programmable Gate Arrays, 2013

Networking industry trends in ESD protection for high speed IOs.

Richard Wong, Rita Fung, Shi-Jie Wen

Proceedings of the IEEE 10th International Conference on ASIC, 2013

2012

Performance, Metastability, and Soft-Error Robustness Trade-offs for Flip-Flops in 40 nm CMOS.

David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Richard Wong

IEEE Trans. Circuits Syst. I Regul. Pap., 2012

Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter.

Yi Ren, L. Fan, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Arthur F. Witulski, Bharat L. Bhuva

J. Electron. Test., 2012

Heterogeneous configuration memory scrubbing for soft error mitigation in FPGAs.

Ju-Yueh Lee, Cheng-Ru Chang, Naifeng Jing, Juexiao Su, Shi-Jie Wen, Rick Wong, Lei He

Proceedings of the 2012 International Conference on Field-Programmable Technology, 2012

2011

Mitigating the effects of large multiple cell upsets (MCUs) in memories.

Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong

ACM Trans. Design Autom. Electr. Syst., 2011

Design and Analysis of Low-Voltage Low-Parasitic ESD Protection for RF ICs in CMOS.

Jian Liu, Xin Wang, Hui Zhao, Qiang Fang, Albert Z. Wang, Lin Lin, He Tang, Siqiang Fan, Bin Zhao, Shi-Jie Wen, Richard Wong

IEEE J. Solid State Circuits, 2011

Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations.

Changmin Jung, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong

Proceedings of the 12th International Symposium on Quality Electronic Design, 2011

Quantitative SEU Fault Evaluation for SRAM-Based FPGA Architectures and Synthesis Algorithms.

Naifeng Jing, Ju-Yueh Lee, Zhe Feng, Weifeng He, Zhigang Mao, Shi-Jie Wen, Rick Wong, Lei He

Proceedings of the International Conference on Field Programmable Logic and Applications, 2011

Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS.

Massoud Mokhtarpour Ghahroodi, Mark Zwolinski, Rick Wong, Shi-Jie Wen

Proceedings of the 16th European Test Symposium, 2011

Performance, metastability and soft-error robustness tradeoffs for flip-flops in 40nm CMOS.

David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Rick Wong

Proceedings of the 2011 IEEE Custom Integrated Circuits Conference, 2011

2010

Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals.

Sanghyeon Baeg, Shi-Jie Wen, Richard Wong

IEEE Trans. Circuits Syst. I Regul. Pap., 2010

2008

Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node.

Damien Leroy, Rémi Gaillard, Erwin Schäfer, Cyrille Beltrando, Shi-Jie Wen, Richard Wong

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

1998

A parallel sort-balance mutual range-join algorithm on hypercube computers.

Richard Wong, Rodney W. Topor, Hong Shen

Microprocess. Microsystems, 1998