D. Lin

According to our database1, D. Lin authored at least 5 papers between 2006 and 2015.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2015
The relationship between border traps characterized by AC admittance and BTI in III-V MOS devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014
An improved t-out-of-n e-lottery protocol.
Int. J. Communication Systems, 2014

2012
Frontend ICs for impulse radio sensing and communications.
Proceedings of the IEEE International Conference on Ultra-Wideband, 2012

2010
Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures.
Microelectronics Reliability, 2010

2006
Using principal components in a proportional hazards model with applications in condition-based maintenance.
JORS, 2006


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