According to our database1, D. Lin
Legend:Book In proceedings Article PhD thesis Other
The relationship between border traps characterized by AC admittance and BTI in III-V MOS devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
An improved t-out-of-n e-lottery protocol.
Int. J. Communication Systems, 2014
Frontend ICs for impulse radio sensing and communications.
Proceedings of the IEEE International Conference on Ultra-Wideband, 2012
Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures.
Microelectronics Reliability, 2010
Using principal components in a proportional hazards model with applications in condition-based maintenance.