A. Asenov

According to our database1, A. Asenov authored at least 92 papers between 1994 and 2022.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Awards

IEEE Fellow

IEEE Fellow 2011, "For contributions to the understanding and prediction of semiconductor device variability via modeling and simulation".

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2022
Carbon Nanotube SRAM in 5-nm Technology Node Design, Optimization, and Performance Evaluation - Part II: CNT Interconnect Optimization.
IEEE Trans. Very Large Scale Integr. Syst., 2022

Carbon Nanotube SRAM in 5-nm Technology Node Design, Optimization, and Performance Evaluation - Part I: CNFET Transistor Optimization.
IEEE Trans. Very Large Scale Integr. Syst., 2022

2021
TCAD Simulation of Novel Semiconductor Devices.
Proceedings of the 14th IEEE International Conference on ASIC, 2021

2019
The First International Competition in Machine Reconnaissance Blind Chess.
Proceedings of the NeurIPS 2019 Competition and Demonstration Track, 2019

Kinetic Monte Carlo Analysis of the Operation and Reliability of Oxide Based RRAMs.
Proceedings of the Large-Scale Scientific Computing - 12th International Conference, 2019

Techniques for Statistical Enhancement in a 2D Multi-subband Ensemble Monte Carlo Nanodevice Simulator.
Proceedings of the Large-Scale Scientific Computing - 12th International Conference, 2019

Advanced Simulation of RRAM Memory Cells.
Proceedings of the 13th IEEE International Conference on ASIC, 2019

2018
Stochastic analysis of surface roughness models in quantum wires.
Comput. Phys. Commun., 2018

Microscopic KMC Modeling of Oxide RRAMs.
Proceedings of the Numerical Methods and Applications - 9th International Conference, 2018

Impact of the Trap Attributes on the Gate Leakage Mechanisms in a 2D MS-EMC Nanodevice Simulator.
Proceedings of the Numerical Methods and Applications - 9th International Conference, 2018

Automatic Segmentation of Lumbar Spine MRI Using Ensemble of 2D Algorithms.
Proceedings of the Computational Methods and Clinical Applications for Spine Imaging, 2018

Progress on carbon nanotube BEOL interconnects.
Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018

2017
Software Server for Automatic Generation of Audio Lectures (uListenSrv).
Int. J. Adv. Corp. Learn., 2017

TCAD based Design-Technology Co-Optimisations in advanced technology nodes.
Proceedings of the 2017 International Symposium on VLSI Design, Automation and Test, 2017

2016
Multivariate Modeling of Variability Supporting Non-Gaussian and Correlated Parameters.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Editorial.
Microelectron. Reliab., 2016

Multi-scale electrothermal simulation and modelling of resistive random access memory devices.
Proceedings of the 26th International Workshop on Power and Timing Modeling, 2016

Nanowire transistor solutions for 5nm and beyond.
Proceedings of the 17th International Symposium on Quality Electronic Design, 2016

2015
Comparison of Si < 100 > and < 110 > crystal orientation nanowire transistor reliability using Poisson-Schrödinger and classical simulations.
Microelectron. Reliab., 2015

Mastering CMOS variability is the key to success.
IET Comput. Digit. Tech., 2015

Circuit design perspectives for Ge FinFET at 10nm and beyond.
Proceedings of the Sixteenth International Symposium on Quality Electronic Design, 2015

Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow.
Proceedings of the 45th European Solid State Device Research Conference, 2015

Experimental evidences and simulations of trap generation along a percolation path.
Proceedings of the 45th European Solid State Device Research Conference, 2015

2014
Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review.
Microelectron. Reliab., 2014

RTN distribution comparison for bulk, FDSOI and FinFETs devices.
Microelectron. Reliab., 2014

Special section reliability and variability of devices for circuits and systems.
Microelectron. Reliab., 2014

Multi-scale Computational Framework for Evaluating of the Performance of Molecular Based Flash Cells.
Proceedings of the Numerical Methods and Applications - 8th International Conference, 2014

Factoring variability in the Design/Technology Co Optimisation (DTCO) in advanced CMOS.
Proceedings of the 19th IEEE European Test Symposium, 2014

Accurate simulations of the interplay between process and statistical variability for nanoscale FinFET-based SRAM cell stability.
Proceedings of the 44th European Solid State Device Research Conference, 2014

FDSOI molecular flash cell with reduced variability for low power flash applications.
Proceedings of the 44th European Solid State Device Research Conference, 2014

2013
Analytical Models for Three-Dimensional Ion Implantation Profiles in FinFETs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013

Impact of statistical parameter set selection on the statistical compact model accuracy: BSIM4 and PSP case study.
Microelectron. J., 2013

Statistical Variability and Reliability and the Impact on Corresponding 6T-SRAM Cell Design for a 14-nm Node SOI FinFET Technology.
IEEE Des. Test, 2013

SRAM device and cell co-design considerations in a 14nm SOI FinFET technology.
Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013

Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models.
Proceedings of 2013 International Conference on IC Design & Technology, 2013

Impact of statistical variability and charge trapping on 14 nm SOI FinFET SRAM cell stability.
Proceedings of the European Solid-State Device Research Conference, 2013

Multi-scale computational framework for the evaluation of variability in the programing window of a flash cell with molecular storage.
Proceedings of the European Solid-State Device Research Conference, 2013

Investigation of SRAM using BTI-aware statistical compact models.
Proceedings of the European Solid-State Device Research Conference, 2013

Predicting future technology performance.
Proceedings of the 50th Annual Design Automation Conference 2013, 2013

2012
Impact of random dopant fluctuations on trap-assisted tunnelling in nanoscale MOSFETs.
Microelectron. Reliab., 2012

ICMAT 2011 - Reliability and variability of semiconductor devices and ICs.
Microelectron. Reliab., 2012

Accurate capturing of the statistical aspect of NBTI/PBTI variability into statistical compact models.
Microelectron. J., 2012

A framework to study time-dependent variability in circuits at sub-35nm technology nodes.
Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012

Analysis of FinFET technology on memories.
Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012

Statistical variability in 14-nm node SOI FinFETs and its impact on corresponding 6T-SRAM cell design.
Proceedings of the 2012 European Solid-State Device Research Conference, 2012

An advanced statistical compact model strategy for SRAM simulation at reduced VDD.
Proceedings of the 2012 European Solid-State Device Research Conference, 2012

Comprehensive statistical comparison of RTN and BTI in deeply scaled MOSFETs by means of 3D 'atomistic' simulation.
Proceedings of the 2012 European Solid-State Device Research Conference, 2012

2011
Implementation of the Density Gradient Quantum Corrections for 3-D Simulations of Multigate Nanoscaled Transistors.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011

TRAMS Project: Variability and Reliability of SRAM Memories in sub-22 nm Bulk-CMOS Technologies.
Proceedings of the 2nd European Future Technologies Conference and Exhibition, 2011

The evolution of standard cell libraries for future technology nodes.
Genet. Program. Evolvable Mach., 2011

New reliability mechanisms in memory design for sub-22nm technologies.
Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011

Modelling circuit performance variations due to statistical variability: Monte Carlo static timing analysis.
Proceedings of the Design, Automation and Test in Europe, 2011

Statistical aspects of NBTI/PBTI and impact on SRAM yield.
Proceedings of the Design, Automation and Test in Europe, 2011

2010
Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures.
Microelectron. Reliab., 2010

Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP.
IEEE Des. Test Comput., 2010

Advanced Monte Carlo Techniques in the Simulation of CMOS Devices and Circuits.
Proceedings of the Numerical Methods and Applications - 7th International Conference, 2010

Statistical NBTI-effect prediction for ULSI circuits.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

Capturing intrinsic parameter fluctuations using the PSP compact model.
Proceedings of the Design, Automation and Test in Europe, 2010

Modeling and simulation of transistor and circuit variability and reliability.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2010

2009
Enabling Cutting-Edge Semiconductor Simulation through Grid Technology.
Proceedings of the Large-Scale Scientific Computing, 7th International Conference, 2009

Impact of Random Dopant Induced Statistical Variability on Inverter Switching Trajectories and Timing Variability.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2009), 2009

2008
Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET.
Microelectron. Reliab., 2008

Statistical aspects of reliability in bulk MOSFETs with multiple defect states and random discrete dopants.
Microelectron. Reliab., 2008

Supercomputing at Work in the nanoCMOS Electronics Domain.
ERCIM News, 2008

Integrating Security Solutions to Support nanoCMOS Electronics Research.
Proceedings of the IEEE International Symposium on Parallel and Distributed Processing with Applications, 2008

Secure, Performance-Oriented Data Management for nanoCMOS Electronics.
Proceedings of the Fourth International Conference on e-Science, 2008

2007
Statistical Device Variability and its Impact on Yield and Performance.
Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

The scalability of 8T-SRAM cells under the influence of intrinsic parameter fluctuations.
Proceedings of the 33rd European Solid-State Circuits Conference, 2007

Towards a Grid-Enabled Simulation Framework for Nano-CMOS Electronics.
Proceedings of the Third International Conference on e-Science and Grid Computing, 2007

2005
A High-Performance Parallel Device Simulator for High Electron Mobility Transistors.
Proceedings of the Parallel Computing: Current & Future Issues of High-End Computing, 2005

2004
Impact of device geometry and doping strategy on linearity and RF performance in Si/SiGe MODFETs.
Microelectron. Reliab., 2004

2003
Nonequilibrium and ballistic transport, and backscattering in decanano HEMTs: a Monte Carlo simulation study.
Math. Comput. Simul., 2003

2001
Non-Equilibrium Hole Transport in Deep Sub-Micron Well-Tempered Si <i>p</i>-MOSFETs.
VLSI Design, 2001

Soft Sphere Model for Electron Correlation and Scattering in the Atomistic Modelling of Semiconductor Devices.
VLSI Design, 2001

Scaling of pHEMTs to Decanano Dimensions.
VLSI Design, 2001

IWCE-7 Committees.
VLSI Design, 2001

Quantum Corrections to the 'Atomistic' MOSFET Simulations.
VLSI Design, 2001

1999
Hierarchical approach to "atomistic" 3-D MOSFET simulation.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999

1998
RF Performance of Si/SiGe MODFETs: A Simulation Study.
VLSI Design, 1998

3D Parallel Finite Element Simulation of In-Cell Breakdown in Lateral-Channel IGBTs.
VLSI Design, 1998

Complete RF Analysis of Compound FETs Based on Transient Monte Carlo Simulation.
VLSI Design, 1998

Quadrilateral Finite Element Monte Carlo Simulation of Complex Shape Compound FETs.
VLSI Design, 1998

Topologically Rectangular Grids in the Parallel Simulation of Semiconductor Devices.
VLSI Design, 1998

Monte Carlo Calibrated Drift-Diffusion Simulation of Short Channel HFETs.
VLSI Design, 1998

Ab-initio Coulomb Scattering in Atomistic Device Simulation.
VLSI Design, 1998

A New Approach based on Brownian Motion for the Simulation of Ultra-Small Semiconductor Devices.
VLSI Design, 1998

1996
Scalable parallel 3D finite element nonlinear Poisson solver.
Simul. Pract. Theory, 1996

Optimum partitioning of topologically rectangular grids.
Proceedings of the EUROSIM'96, 1996

1995
A Virtual IC Factory in an Undergraduate Semiconductor Device Fabrication Laboratory.
Proceedings of the EUROSIM'96, 1995

1994
Speed-Up of Scalable Iterative Linear Solvers Implemented on an Array of Transputers.
Parallel Comput., 1994

Parallel Simulation of Semiconductor Devices.
Proceedings of the Massively Parallel Processing Applications and Develompent, 1994


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