Dennis J. Ciplickas

According to our database, Dennis J. Ciplickas authored at least 4 papers between 1996 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2019

Yield and Reliability Challenges at 7nm and Below.

Andrzej J. Strojwas, Kelvin Doong, Dennis J. Ciplickas

Proceedings of the 26th International Conference on Mixed Design of Integrated Circuits and Systems, 2019

2013

Special session 12B: Panel post-silicon validation & test in huge variance era.

Takahiro J. Yamaguchi, Jacob A. Abraham, Gordon W. Roberts, Suriyaprakash Natarajan, Dennis J. Ciplickas

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

2007

Processing High Volume Scan Test Results for Yield Learning.

Alfred L. Crouch, Phil Burlison, Dennis J. Ciplickas

Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007

1996

Expected current distributions for CMOS circuits.

Dennis J. Ciplickas, Ronald A. Rohrer

Proceedings of the 1996 IEEE/ACM International Conference on Computer-Aided Design, 1996