Dennis Weller

According to our database, Dennis Weller authored at least 14 papers between 2017 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

Fast and Efficient High-Sigma Yield Analysis and Optimization Using Kernel Density Estimation on a Bayesian Optimized Failure Rate Model.

Dennis D. Weller, Michael Hefenbrock, Michael Beigl, Mehdi B. Tahoori

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

Artificial Neurons on Flexible Substrates: A Fully Printed Approach for Neuromorphic Sensing.

Surya A. Singaraju, Dennis D. Weller, Thurid S. Gspann, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori

Sensors, 2022

In-situ Tuning of Printed Neural Networks for Variation Tolerance.

Michael Hefenbrock, Dennis D. Weller, Jasmin Aghassi-Hagmann, Michael Beigl, Mehdi B. Tahoori

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2021

Digital and Analog Computing Paradigms in Printed Electronics.

Dennis Weller

PhD thesis, 2021

Printed Stochastic Computing Neural Networks.

Dennis D. Weller, Nathaniel Bleier, Michael Hefenbrock, Jasmin Aghassi-Hagmann, Michael Beigl, Rakesh Kumar, Mehdi B. Tahoori

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

2020

A Novel Printed-Lookup-Table-Based Programmable Printed Digital Circuit.

Ahmet Turan Erozan, Dennis D. Weller, Farhan Rasheed, Rajendra Bishnoi, Jasmin Aghassi-Hagmann, Mehdi Baradaran Tahoori

IEEE Trans. Very Large Scale Integr. Syst., 2020

A Printed Camouflaged Cell Against Reverse Engineering of Printed Electronics Circuits.

Ahmet Turan Erozan, Dennis D. Weller, Yijing Feng, Gabriel Cadilha Marques, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori

IEEE Trans. Very Large Scale Integr. Syst., 2020

Bayesian Optimized Mixture Importance Sampling for High-Sigma Failure Rate Estimation.

Dennis D. Weller, Michael Hefenbrock, Mohammad Saber Golanbari, Michael Beigl, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

Printed Machine Learning Classifiers.

Muhammad Husnain Mubarik, Dennis D. Weller, Nathaniel Bleier, Matthew Tomei, Jasmin Aghassi-Hagmann, Mehdi B. Tahoori, Rakesh Kumar

Proceedings of the 53rd Annual IEEE/ACM International Symposium on Microarchitecture, 2020

Fast and Accurate High-Sigma Failure Rate Estimation through Extended Bayesian Optimized Importance Sampling.

Michael Hefenbrock, Dennis D. Weller, Michael Beigl, Mehdi Baradaran Tahoori

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

Programmable Neuromorphic Circuit based on Printed Electrolyte-Gated Transistors.

Dennis D. Weller, Michael Hefenbrock, Mehdi Baradaran Tahoori, Jasmin Aghassi-Hagmann, Michael Beigl

Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020

2019

Towards Virtualization of Operational Technology to Enable Large-Scale System Testing.

Shoaib Ansari, Felipe Castro, Dennis Weller, Davood Babazadeh, Sebastian Lehnhoff

Proceedings of the IEEE EUROCON 2019, 2019

Bayesian Optimized Importance Sampling for High Sigma Failure Rate Estimation.

Dennis D. Weller, Michael Hefenbrock, Mohammad Saber Golanbari, Michael Beigl, Mehdi Baradaran Tahoori

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

2017

Energy Efficient Scientific Computing on FPGAs using OpenCL.

Dennis Weller, Fabian Oboril, Dimitar Lukarski, Jürgen Becker, Mehdi Baradaran Tahoori

Proceedings of the 2017 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays, 2017