Dennis Weller
Orcid: 0000-0002-0251-4596
According to our database1,
Dennis Weller
authored at least 14 papers
between 2017 and 2022.
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Bibliography
2022
Fast and Efficient High-Sigma Yield Analysis and Optimization Using Kernel Density Estimation on a Bayesian Optimized Failure Rate Model.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022
Artificial Neurons on Flexible Substrates: A Fully Printed Approach for Neuromorphic Sensing.
Sensors, 2022
Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022
2021
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021
2020
IEEE Trans. Very Large Scale Integr. Syst., 2020
A Printed Camouflaged Cell Against Reverse Engineering of Printed Electronics Circuits.
IEEE Trans. Very Large Scale Integr. Syst., 2020
Bayesian Optimized Mixture Importance Sampling for High-Sigma Failure Rate Estimation.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
Proceedings of the 53rd Annual IEEE/ACM International Symposium on Microarchitecture, 2020
Fast and Accurate High-Sigma Failure Rate Estimation through Extended Bayesian Optimized Importance Sampling.
Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020
Proceedings of the 25th Asia and South Pacific Design Automation Conference, 2020
2019
Towards Virtualization of Operational Technology to Enable Large-Scale System Testing.
Proceedings of the IEEE EUROCON 2019, 2019
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019
2017
Proceedings of the 2017 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays, 2017