Mohammad Saber Golanbari

IEEE Trans. Very Large Scale Integr. Syst., 2020

Bayesian Optimized Mixture Importance Sampling for High-Sigma Failure Rate Estimation.

[BibT_eX]

[DOI]

Dennis D. Weller

Michael Hefenbrock

Michael Beigl

Jasmin Aghassi-Hagmann

Mehdi B. Tahoori

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

Selective Flip-Flop Optimization for Reliable Digital Circuit Design.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

2019

Design and Optimization for Resilient Energy Efficient Computing

[BibT_eX]

[DOI]

PhD thesis, 2019

Bayesian Optimized Importance Sampling for High Sigma Failure Rate Estimation.

[BibT_eX]

[DOI]

Dennis D. Weller

Michael Hefenbrock

Michael Beigl

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

2018

Inkjet-Printed EGFET-Based Physical Unclonable Function - Design, Evaluation, and Fabrication.

[BibT_eX]

[DOI]

Ahmet Turan Erozan

Gabriel Cadilha Marques

Simone Dehm

Jasmin Aghassi-Hagmann

Sarath Mohanachandran Nair

IEEE Trans. Very Large Scale Integr. Syst., 2018

VAET-STT: Variation Aware STT-MRAM Analysis and Design Space Exploration Tool.

[BibT_eX]

[DOI]

Fazal Hameed

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

Optimizing Datapaths for Near Threshold Computing.

[BibT_eX]

[DOI]

Proceedings of the 15th International Conference on Synthesis, 2018

Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Test Conference, 2018

Reliable memory PUF design for low-power applications.

[BibT_eX]

[DOI]

Proceedings of the 19th International Symposium on Quality Electronic Design, 2018

Design and evaluation of physical unclonable function for inorganic printed electronics.

[BibT_eX]

[DOI]

Ahmet Turan Erozan

Jasmin Aghassi-Hagmann

Proceedings of the 19th International Symposium on Quality Electronic Design, 2018

Runtime adjustment of IoT system-on-chips for minimum energy operation.

[BibT_eX]

[DOI]

Proceedings of the 55th Annual Design Automation Conference, 2018

Balancing resiliency and energy efficiency of functional units in ultra-low power systems.

[BibT_eX]

[DOI]

Elyas Moradi

Proceedings of the 23rd Asia and South Pacific Design Automation Conference, 2018

2017

Temperature-Aware Dynamic Voltage Scaling to Improve Energy Efficiency of Near-Threshold Computing.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2017

Post-fabrication calibration of Near-Threshold circuits for energy efficiency.

[BibT_eX]

[DOI]

Proceedings of the 18th International Symposium on Quality Electronic Design, 2017

Design flows for resilient energy-efficient systems.

[BibT_eX]

[DOI]

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

Aging-aware coding scheme for memory arrays.

[BibT_eX]

[DOI]

Nour Sayed

Mohammad Hadi Moshrefpour Esfahany

Sarath Mohanachandran Nair

Proceedings of the 22nd IEEE European Test Symposium, 2017

VAET-STT: A variation aware estimator tool for STT-MRAM based memories.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

Leveraging aging effect to improve SRAM-based true random number generators.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

2016

Hold-time violation analysis and fixing in near-threshold region.

[BibT_eX]

[DOI]

Proceedings of the 26th International Workshop on Power and Timing Modeling, 2016

Maximizing Energy Efficiency in NTC by Variation-Aware Microprocessor Pipeline Optimization.

[BibT_eX]

[DOI]

Proceedings of the 2016 International Symposium on Low Power Electronics and Design, 2016

A cross-layer approach for resiliency and energy efficiency in near threshold computing.

[BibT_eX]

[DOI]

Proceedings of the 35th International Conference on Computer-Aided Design, 2016

Variation-aware near threshold circuit synthesis.

[BibT_eX]

[DOI]

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

Fault injection acceleration by simultaneous injection of non-interacting faults.

[BibT_eX]

[DOI]

Mohammad Hadi Moshrefpour

Proceedings of the 53rd Annual Design Automation Conference, 2016

2015

Analysis and optimization of flip-flops under process and runtime variations.

[BibT_eX]

[DOI]

Sani R. Nassif

Proceedings of the Sixteenth International Symposium on Quality Electronic Design, 2015

Aging guardband reduction through selective flip-flop optimization.

[BibT_eX]

[DOI]