Michael Laisne

According to our database, Michael Laisne authored at least 11 papers between 2006 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

IEEE P1687.1: Extending the Network Boundaries for Test.

Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo

Proceedings of the IEEE International Test Conference, 2022

2020

Industrial Application of IJTAG Standards to the Test of Big-A/little-d devices.

Hans Martin von Staudt, Mohamed Anas Benhebibi, Jeff Rearick, Michael Laisne

Proceedings of the IEEE International Test Conference, 2020

Modeling Novel Non-JTAG IEEE 1687-Like Architectures.

Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick

Proceedings of the IEEE International Test Conference, 2020

2017

Generalizing Access to Instrumentation Embedded in a Semiconductor Device.

Al Crouch, Michael Laisne, Martin Keim

Computer, 2017

Single-pin test control for Big A, little D devices.

Michael Laisne, Hans Martin von Staudt, Sourabh Bhalerao, Mark Eason

Proceedings of the IEEE International Test Conference, 2017

2011

Advanced methods for leveraging new test standards.

Mike Laisne

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Wafer probe test cost reduction of an RF/A device by automatic testset minimization - A case study.

Dragoljub Gagi Drmanac, Michael Laisne

Proceedings of the 2011 IEEE International Test Conference, 2011

2007

Function-based ATPG for Path Delay Faults using the Launch-Off-Capture Scan Architecture.

Edward Flanigan, Rajsekhar Adapa, Hailong Cui, Michael Laisne, Spyros Tragoudas, Tsvetomir Petrov

Proceedings of the 20th International Conference on VLSI Design (VLSI Design 2007), 2007

Verification and debugging of IDDQ test of low power chips.

Michael Laisne, Triphuong Nguyen, Songlin Zuo, Xiangdong Pan, Hailong Cui, Cher Bai, A. Street, M. Parley, Neetu Agrawal, K. Sundararaman

Proceedings of the 2007 IEEE International Test Conference, 2007

Function-Based Test Generation for (Non-Robust) Path Delay Faults Using the Launch-off-Capture Scan Architecture.

Rajsekhar Adapa, Edward Flanigan, Spyros Tragoudas, Michael Laisne, Hailong Cui, Tsvetomir Petrov

Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007

2006

IEEE P1687: Toward Standardized Access of Embedded Instrumentation.

Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, Jean-Francois Cote

Proceedings of the 2006 IEEE International Test Conference, 2006