Eric Bruls

According to our database, Eric Bruls authored at least 8 papers between 1991 and 1997.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

1997

Built-in self-test methodology for A/D converters.

R. de Vries, Taco Zwemstra, E. M. J. G. Bruls, Paul P. L. Regtien

Proceedings of the European Design and Test Conference, 1997

1996

Bridging defects resistance in the metal layer of a CMOS process.

Rosa Rodríguez-Montañés, E. M. J. G. Bruls, Joan Figueras

J. Electron. Test., 1996

Test Quality of Asynchronous Circuits: A Defect-oriented Evaluation.

Marly Roncken, Eric Bruls

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1994

Analogue Fault Simulation Based on Layout-Dependent Fault Models.

R. J. A. Harvey, Andrew Mark David Richardson, Eric Bruls, Keith Baker

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

Variable Supply Voltage Testing for Analogue CMOS and Bipolar Circuits.

Eric Bruls

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1993

Parameter Monitoring: Advantages and Pitfalls.

M. M. A. van Rosmalen, Keith Baker, Eric Bruls, Jochen A. G. Jess

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1992

Bridging Defects Resistance Measurements in a CMOS Process.

Rosa Rodríguez-Montañés, Joan Figueras, Eric Bruls

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1991

A Generic Method to Develop a Defect Monitoring System for IC Processes.

Eric Bruls, F. Camerik, H. J. Kretschman, Jochen A. G. Jess

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991