Evan Shieh

According to our database, Evan Shieh authored at least 6 papers between 2021 and 2026.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2026

Representational Harms in LLM-Generated Narratives Against Global Majority Nationalities.

Ilana Nguyen, Harini Suresh, Thema Monroe-White, Evan Shieh

Proceedings of the 2026 ACM Conference on Fairness, Accountability, and Transparency, 2026

2025

Language Models Generate Widespread Intersectional Biases in Narratives of Learning, Labor, and Love.

Evan Shieh, Faye-Marie Vassel, Cassidy R. Sugimoto, Thema Monroe-White

Proceedings of the 5th ACM Conference on Equity and Access in Algorithms, 2025

Model AI Assignments 2025.

Todd W. Neller, Rasika Bhalerao, Eun Kyung Ko, Vishodana Thamotharan, Lisa Zhang, Sonya Allin, Mahdi Haghifam, Michael Pawliuk, Rutwa Engineer, Florian Shkurti, Cunyan Ma, Daniella DiPaola, Cynthia Breazeal, Loreto Alonzi, Brian Wright, Ali Rivera, Kristin Fasiang, Duri Long, Shruthi Chockkalingam, Giulia Toti, Evan Shieh, Princewill Okoroafor, Thema Monroe-White, Mustafa Haiderbhai, Carolyn Quinlan, Ashwin R. Bharadwaj, Anio Zhang, Rajagopal Venkatesaramani, Sarah Wharton, John Masla, Lydia Guterman, Mary Cate Gustafson-Quiett, Christina A. Bosch, Samar Abu Hegley, Calvin Macatantan, Eric Klopfer, Hal Abelson, Shira Wein, Mercy Wairimu Gachoka, Li-Hsin Chang, Maryam Mirzaei, Mohammad Mahdi Ajallooeian

Proceedings of the Thirty-Ninth AAAI Conference on Artificial Intelligence, 2025

2024

Laissez-Faire Harms: Algorithmic Biases in Generative Language Models.

Evan Shieh, Faye-Marie Vassel, Cassidy R. Sugimoto, Thema Monroe-White

CoRR, 2024

The Psychosocial Impacts of Generative AI Harms.

Faye-Marie Vassel, Evan Shieh, Cassidy R. Sugimoto, Thema Monroe-White

Proceedings of the AAAI 2024 Spring Symposium Series, 2024

2021

Attribute Similarity and Relevance-Based Product Schema Matching for Targeted Catalog Enrichment.

Evan Shieh, Saul Simhon, Geetha Aluri, Georgios Papachristoudis, Doa Yakut, Dhanya Raghu

Proceedings of the 2021 IEEE International Conference on Big Knowledge, 2021