Nicolas Nolhier

According to our database, Nicolas Nolhier authored at least 18 papers between 1999 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes.

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia

IEEE Trans. Instrum. Meas., 2021

2017

Prediction of LIN communication robustness against EFT events using dedicated failure models.

Frédéric Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur

Microelectron. Reliab., 2017

2016

Impact of non-linear capacitances on transient waveforms during system level ESD stress.

Frédéric Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur

Microelectron. Reliab., 2016

2015

20 GHz on-chip measurement of ESD waveform for system level analysis.

Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran

Microelectron. Reliab., 2015

Editorial.

Marise Bafleur, Philippe Perdu, François Marc, Hélène Frémont, Nicolas Nolhier

Microelectron. Reliab., 2015

2014

Reliability of ESD protection devices designed in a 3D technology.

Bertrand Courivaud, Nicolas Nolhier, Gilles Ferru, Marise Bafleur, Fabrice Caignet

Microelectron. Reliab., 2014

2013

Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation.

Nicolas Monnereau, Fabrice Caignet, David Trémouilles, Nicolas Nolhier, Marise Bafleur

Microelectron. Reliab., 2013

On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress.

Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran

Microelectron. Reliab., 2013

2012

An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices.

Jinyu Jason Ruan, Nicolas Monnereau, David Trémouilles, Nicolas Mauran, Fabio Coccetti, Nicolas Nolhier, Robert Plana

IEEE Trans. Instrum. Meas., 2012

2009

Accelerated lifetime test of RF-MEMS switches under ESD stress.

Jinyu Jason Ruan, Nicolas Nolhier, George J. Papaioannou, David Trémouilles, Vincent Puyal, C. Villeneuve, T. Idda, Fabio Coccetti, Robert Plana

Microelectron. Reliab., 2009

2008

ESD failure signature in capacitive RF MEMS switches.

Jinyu Jason Ruan, George J. Papaioannou, Nicolas Nolhier, Nicolas Mauran, Marise Bafleur, Fabio Coccetti, Robert Plana

Microelectron. Reliab., 2008

2007

Electrostatic discharge failure analysis of capacitive RF MEMS switches.

Jinyu Jason Ruan, Nicolas Nolhier, Marise Bafleur, Laurent Bary, Fabio Coccetti, T. Lisec, Robert Plana

Microelectron. Reliab., 2007

2005

Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure.

Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2005

2004

Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications.

Nicolas Guitard, David Trémouilles, Marise Bafleur, Laurent Escotte, Laurent Bary, Philippe Perdu, Gérard Sarrabayrouse, Nicolas Nolhier, Roberto Reyna-Rojas

Microelectron. Reliab., 2004

Latch-up ring design guidelines to improve electrostatic discharge (ESD) protection scheme efficiency.

David Trémouilles, Marise Bafleur, Géraldine Bertrand, Nicolas Nolhier, Nicolas Mauran, Lionel Lescouzères

IEEE J. Solid State Circuits, 2004

2003

Determination of the ESD Failure Cause Through its Signature.

M. Zecri, P. Besse, Philippe Givelin, M. Nayrolles, Marise Bafleur, Nicolas Nolhier

Microelectron. Reliab., 2003

2001

Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology.

Géraldine Bertrand, Christelle Delage, Marise Bafleur, Nicolas Nolhier, Jean-Marie Dorkel, Quang Nguyen, Nicolas Mauran, David Trémouilles, Philippe Perdu

IEEE J. Solid State Circuits, 2001

1999

The mirrored lateral SCR (MILSCR) as an ESD protection structure: design and optimization using 2-D device simulation.

Christelle Delage, Nicolas Nolhier, Marise Bafleur, Jean-Marie Dorkel, Jo Hamid, Philippe Givelin, Jacques Lin-Kwang

IEEE J. Solid State Circuits, 1999