Marise Bafleur

According to our database1, Marise Bafleur authored at least 38 papers between 1996 and 2018.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2018
A power management system using reconfigurable storage scheme for batteryless wireless sensor nodes.
Proceedings of the 7th International Conference on Modern Circuits and Systems Technologies, 2018

Energy-harvesting powered variable storage topology for battery-free wireless sensors.
Proceedings of the 7th International Conference on Modern Circuits and Systems Technologies, 2018

2017
Single Piezoelectric Transducer as Strain Sensor and Energy Harvester Using Time-Multiplexing Operation.
IEEE Trans. Ind. Electron., 2017

New triggering-speed-characterization method for diode-triggered SCR using TLP.
Microelectron. Reliab., 2017

Proceedings of the 28th European Symposium on the reliability of electron devices, failure physics and analysis.
Microelectron. Reliab., 2017

Prediction of LIN communication robustness against EFT events using dedicated failure models.
Microelectron. Reliab., 2017

2016
Impact of non-linear capacitances on transient waveforms during system level ESD stress.
Microelectron. Reliab., 2016

A multifunctional device as both strain sensor and energy harvester for structural health monitoring.
Proceedings of the 2016 IEEE SENSORS, Orlando, FL, USA, October 30 - November 3, 2016, 2016

2015
20 GHz on-chip measurement of ESD waveform for system level analysis.
Microelectron. Reliab., 2015

Editorial.
Microelectron. Reliab., 2015

Optimization of a MOS-IGBT-SCR ESD protection component in smart power SOI technology.
Microelectron. Reliab., 2015

2014
Reliability of ESD protection devices designed in a 3D technology.
Microelectron. Reliab., 2014

2013
Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation.
Microelectron. Reliab., 2013

On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress.
Microelectron. Reliab., 2013

Towards Energy Autonomy of Wireless Sensors in Aeronautics Applications: SMARTER Collaborative Project.
Proceedings of the 2013 IEEE International Conference on Green Computing and Communications (GreenCom) and IEEE Internet of Things (iThings) and IEEE Cyber, 2013

2012
Energy Harvesting for Powering Wireless Sensor Networks On-Board Geostationary Broadcasting Satellites.
Proceedings of the 2012 IEEE International Conference on Green Computing and Communications, 2012

2011
Comparative study of sensitive volume and triggering criteria of SEB in 600 V planar and trench IGBTs.
Microelectron. Reliab., 2011

MOS-IGBT power devices for high-temperature operation in smart power SOI technology.
Microelectron. Reliab., 2011

2010
Evaluation of the ESD performance of local protections based on SCR or bi-SCR with dynamic or static trigger circuit in 32 nm.
Microelectron. Reliab., 2010

2009
Failure mechanisms of discrete protection device subjected to repetitive electrostatic discharges (ESD).
Microelectron. Reliab., 2009

2008
ESD failure signature in capacitive RF MEMS switches.
Microelectron. Reliab., 2008

2007
Electrostatic discharge failure analysis of capacitive RF MEMS switches.
Microelectron. Reliab., 2007

Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements.
Microelectron. Reliab., 2007

Long-term reliability of silicon bipolar transistors subjected to low constraints.
Microelectron. Reliab., 2007

2006
Application of various optical techniques for ESD defect localization.
Microelectron. Reliab., 2006

Potentialities of substrate-thinning technique to control minority carrier injection in smart power IC's.
Microelectron. J., 2006

2005
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure.
Microelectron. Reliab., 2005

2004
Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications.
Microelectron. Reliab., 2004

Study of the ESD defects impact on ICs reliability.
Microelectron. Reliab., 2004

Latch-up ring design guidelines to improve electrostatic discharge (ESD) protection scheme efficiency.
IEEE J. Solid State Circuits, 2004

2003
Determination of the ESD Failure Cause Through its Signature.
Microelectron. Reliab., 2003

TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology.
Microelectron. Reliab., 2003

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.
Microelectron. Reliab., 2003

2002
In the memory of Georges Charitat.
Microelectron. Reliab., 2002

2001
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation.
Microelectron. Reliab., 2001

Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology.
IEEE J. Solid State Circuits, 2001

1999
The mirrored lateral SCR (MILSCR) as an ESD protection structure: design and optimization using 2-D device simulation.
IEEE J. Solid State Circuits, 1999

1996
A current conveyor based BIC sensor for current monitoring in mixed-signal circuits.
Proceedings of Third International Conference on Electronics, Circuits, and Systems, 1996


  Loading...