Fabrice Caignet

Orcid: 0000-0003-2166-9347

According to our database1, Fabrice Caignet authored at least 10 papers between 2000 and 2021.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

On csauthors.net:

Bibliography

2021
Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes.
IEEE Trans. Instrum. Meas., 2021

2017
Prediction of LIN communication robustness against EFT events using dedicated failure models.
Microelectron. Reliab., 2017

2016
Impact of non-linear capacitances on transient waveforms during system level ESD stress.
Microelectron. Reliab., 2016

2015
20 GHz on-chip measurement of ESD waveform for system level analysis.
Microelectron. Reliab., 2015

2014
Reliability of ESD protection devices designed in a 3D technology.
Microelectron. Reliab., 2014

2013
Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation.
Microelectron. Reliab., 2013

On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress.
Microelectron. Reliab., 2013

2008
Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits.
Microelectron. J., 2008

2001
The challenge of signal integrity in deep-submicrometer CMOS technology.
Proc. IEEE, 2001

2000
On the measurement of crosstalk in integrated circuits.
IEEE Trans. Very Large Scale Integr. Syst., 2000


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