Sonia Bendhia

According to our database, Sonia Bendhia authored at least 21 papers between 2001 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes.

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia

IEEE Trans. Instrum. Meas., 2021

2015

Electronic counterfeit detection based on the measurement of electromagnetic fingerprint.

He Huang, Alexandre Boyer, Sonia Ben Dhia

Microelectron. Reliab., 2015

Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC-DC converter.

He Huang, Alexandre Boyer, Sonia Bendhia

Microelectron. Reliab., 2015

Bandgap failure study due to parasitic bipolar substrate coupling in Smart Power mixed ICs.

Veljko Tomasevic, Alexandre Boyer, Sonia Ben Dhia

Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015

2014

Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits.

Alexandre Boyer, Sonia Ben Dhia

J. Low Power Electron., 2014

Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing.

Sonia Ben Dhia, Alexandre Boyer

Proceedings of the 15th Latin American Test Workshop, 2014

2013

LDO regulator DC characteristic and susceptibility prediction after electrical stress ageing.

Jianfei Wu, Alexandre Boyer, Jiancheng Li, Sonia Bendhia, Bertrand Vrignon

Microelectron. Reliab., 2013

Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project.

Sonia Ben Dhia, Alexandre Boyer

Microelectron. Reliab., 2013

Effect of aging on power integrity of digital integrated circuits.

Alexandre Boyer, Sonia Ben Dhia

Proceedings of the 14th Latin American Test Workshop, 2013

Electro-magnetic robustness of integrated circuits: from statement to prediction.

Sonia Ben Dhia, Alexandre Boyer

Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013

Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission.

Alexandre Boyer, Sonia Ben Dhia

Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013

2012

On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations.

Sonia Bendhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro, Thanh Vinh Dinh

IEEE Trans. Instrum. Meas., 2012

IC Immunity Modeling Process Validation Using On-Chip Measurements.

Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro

J. Electron. Test., 2012

Prediction of Long-term Immunity of a Phase-Locked Loop.

Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Christophe Lemoine, Bertrand Vrignon

J. Electron. Test., 2012

2011

Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences.

Binhong Li, Néstor Berbel, Alexandre Boyer, Sonia Bendhia, Raúl Fernández-García

Microelectron. Reliab., 2011

Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout.

Néstor Berbel, Raúl Fernández-García, Ignacio Gil, Binhong Li, Alexandre Boyer, Sonia Bendhia

Microelectron. Reliab., 2011

A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior.

Raúl Fernández-García, Ignacio Gil, Alexandre Boyer, Sonia Bendhia, Bertrand Vrignon

IEICE Trans. Electron., 2011

2010

Effective Teaching of the Physical Design of Integrated Circuits Using Educational Tools.

Syed Mahfuzul Aziz, Etienne Sicard, Sonia Ben Dhia

IEEE Trans. Educ., 2010

Ageing effect on electromagnetic susceptibility of a phase locked loop.

Binhong Li, Alexandre Boyer, Sonia Bendhia, Christophe Lemoine

Microelectron. Reliab., 2010

2004

REGINA test mask: research on EMC guidelines for integrated automotive circuits.

C. Lochot, S. Calvet, Sonia Ben Dhia, Etienne Sicard

Microelectron. J., 2004

2001

The challenge of signal integrity in deep-submicrometer CMOS technology.

Fabrice Caignet, Sonia Delmas-Bendhia, Etienne Sicard

Proc. IEEE, 2001