Farrokh Ghani Zadegan

According to our database, Farrokh Ghani Zadegan authored at least 22 papers between 2010 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

Reusing IEEE 1687-Compatible Instruments and Sub-Networks over a System Bus.

Farrokh Ghani Zadegan, Zilin Zhang, Kim Petersén, Erik Larsson

Proceedings of the IEEE International Test Conference, 2022

2018

On-Chip Fault Monitoring Using Self-Reconfiguring IEEE 1687 Networks.

Farrokh Ghani Zadegan, Dimitar Nikolov, Erik Larsson

IEEE Trans. Computers, 2018

Test of Reconfigurable Modules in Scan Networks.

Riccardo Cantoro, Farrokh Ghani Zadegan, Marco Palena, Paolo Pasini, Erik Larsson, Matteo Sonza Reorda

IEEE Trans. Computers, 2018

2017

Reconfigurable On-Chip Instrument Access Networks: Analysis, Design, Operation, and Application.

Farrokh Ghani Zadegan

PhD thesis, 2017

2016

In-field system-health monitoring based on IEEE 1687.

Farrokh Ghani Zadegan, Dimitar Nikolov, Erik Larsson

Proceedings of the 29th IEEE International System-on-Chip Conference, 2016

Accessing on-chip instruments through the life-time of systems.

Erik Larsson, Farrokh Ghani Zadegan

Proceedings of the 17th Latin-American Test Symposium, 2016

Upper-bound computation for optimal retargeting in IEEE1687 networks.

Farrokh Ghani Zadegan, Rene Krenz-Baath, Erik Larsson

Proceedings of the 2016 IEEE International Test Conference, 2016

A suite of IEEE 1687 benchmark networks.

Anton Tsertov, Artur Jutman, Sergei Devadze, Matteo Sonza Reorda, Erik Larsson, Farrokh Ghani Zadegan, Riccardo Cantoro, Mehrdad Montazeri, Rene Krenz-Baath

Proceedings of the 2016 IEEE International Test Conference, 2016

Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks.

Riccardo Cantoro, Mehrdad Montazeri, Matteo Sonza Reorda, Farrokh Ghani Zadegan, Erik Larsson

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

A self-reconfiguring IEEE 1687 network for fault monitoring.

Farrokh Ghani Zadegan, Dimitar Nikolov, Erik Larsson

Proceedings of the 21th IEEE European Test Symposium, 2016

On the diagnostic analysis of IEEE 1687 networks.

Riccardo Cantoro, Mehrdad Montazeri, Matteo Sonza Reorda, Farrokh Ghani Zadegan, Erik Larsson

Proceedings of the 21th IEEE European Test Symposium, 2016

2015

Access time minimization in IEEE 1687 networks.

Rene Krenz-Baath, Farrokh Ghani Zadegan, Erik Larsson

Proceedings of the 2015 IEEE International Test Conference, 2015

On the testability of IEEE 1687 networks.

Riccardo Cantoro, Mehrdad Montazeri, Matteo Sonza Reorda, Farrokh Ghani Zadegan, Erik Larsson

Proceedings of the 24th IEEE Asian Test Symposium, 2015

2014

Robustness of TAP-based scan networks.

Farrokh Ghani Zadegan, Gunnar Carlsson, Erik Larsson

Proceedings of the 2014 International Test Conference, 2014

Fault injection and fault handling: An MPSoC demonstrator using IEEE P1687.

Kim Petersén, Dimitar Nikolov, Urban Ingelsson, Gunnar Carlsson, Farrokh Ghani Zadegan, Erik Larsson

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

Design, Verification, and Application of IEEE 1687.

Farrokh Ghani Zadegan, Erik Larsson, Artur Jutman, Sergei Devadze, Rene Krenz-Baath

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2012

Access Time Analysis for IEEE P1687.

Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson

IEEE Trans. Computers, 2012

Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687.

Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson, Gunnar Carlsson

IEEE Des. Test Comput., 2012

Accessing Embedded DfT Instruments with IEEE P1687.

Erik Larsson, Farrokh Ghani Zadegan

Proceedings of the 21st IEEE Asian Test Symposium, 2012

2011

Design automation for IEEE P1687.

Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson

Proceedings of the Design, Automation and Test in Europe, 2011

Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints.

Farrokh Ghani Zadegan, Urban Ingelsson, Golnaz Asani, Gunnar Carlsson, Erik Larsson

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

Test Time Analysis for IEEE P1687.

Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson

Proceedings of the 19th IEEE Asian Test Symposium, 2010