Rene Krenz-Baath

According to our database, Rene Krenz-Baath authored at least 18 papers between 2007 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Verifying Bio-Electronic Systems.

Joseline Heuer, Rene Krenz-Baath, Roman Obermaisser

Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2023

2017

BASTION: Board and SoC test instrumentation for ageing and no failure found.

Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans G. Kerkhoff, Rene Krenz-Baath, Piet Engelke

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

2016

On Optimization-Based ATPG and Its Application for Highly Compacted Test Sets.

Stephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Computing optimal communication schedules for time-triggered networks using an SMT solver.

Christian Scholer, Rene Krenz-Baath, Ayman Murshed, Roman Obermaisser

Proceedings of the 11th IEEE Symposium on Industrial Embedded Systems, 2016

Upper-bound computation for optimal retargeting in IEEE1687 networks.

Farrokh Ghani Zadegan, Rene Krenz-Baath, Erik Larsson

Proceedings of the 2016 IEEE International Test Conference, 2016

A suite of IEEE 1687 benchmark networks.

Anton Tsertov, Artur Jutman, Sergei Devadze, Matteo Sonza Reorda, Erik Larsson, Farrokh Ghani Zadegan, Riccardo Cantoro, Mehrdad Montazeri, Rene Krenz-Baath

Proceedings of the 2016 IEEE International Test Conference, 2016

2015

Optimal SAT-based scheduler for time-triggered networks-on-a-chip.

Christian Scholer, Rene Krenz-Baath, Ayman Murshed, Roman Obermaisser

Proceedings of the 10th IEEE International Symposium on Industrial Embedded Systems, 2015

Access time minimization in IEEE 1687 networks.

Rene Krenz-Baath, Farrokh Ghani Zadegan, Erik Larsson

Proceedings of the 2015 IEEE International Test Conference, 2015

2014

Optimization-based multiple target test generation for highly compacted test sets.

Stephan Eggersglüß, Kenneth Schmitz, Rene Krenz-Baath, Rolf Drechsler

Proceedings of the 19th IEEE European Test Symposium, 2014

Design, Verification, and Application of IEEE 1687.

Farrokh Ghani Zadegan, Erik Larsson, Artur Jutman, Sergei Devadze, Rene Krenz-Baath

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2013

Industrial Application of IEEE P1687 for an Automotive Product.

Martin Keim, Tom Waayers, Richard Morren, Friedrich Hapke, Rene Krenz-Baath

Proceedings of the 2013 Euromicro Conference on Digital System Design, 2013

Fault collapsing of multi-conditional faults.

Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke

Proceedings of the 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2013

2012

Robust Evaluation of Weighted Random Logic BIST Structures in Industrial Designs.

Rene Krenz-Baath, Friedrich Hapke, Rolf Hinze, Reinhard Meier, Maija Ryynaenen, Andreas Glowatz

Proceedings of the 15th Euromicro Conference on Digital System Design, 2012

A new SAT-based ATPG for generating highly compacted test sets.

Stephan Eggersglüß, Rene Krenz-Baath, Andreas Glowatz, Friedrich Hapke, Rolf Drechsler

Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

2010

Defect-oriented cell-internal testing.

Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger

Proceedings of the 2011 IEEE International Test Conference, 2010

Improving CNF representations in SAT-based ATPG for industrial circuits using BDDs.

Daniel Tille, Stephan Eggersglüß, Rene Krenz-Baath, Jürgen Schlöffel, Rolf Drechsler

Proceedings of the 15th European Test Symposium, 2010

2009

Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs.

Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson

Proceedings of the 2009 IEEE International Test Conference, 2009

2007

Computation and Application of Absolute Dominators in Industrial Designs.

Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel

Proceedings of the 12th European Test Symposium, 2007