Florent Miller

According to our database, Florent Miller authored at least 9 papers between 2006 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2022

Using Application Profiling based on a Virtual Platform for SoC Fault Tolerance Assessment.

Luc Noizette, Florent Miller, Thierry Colladant, Youri Helen, Régis Leveugle

Proceedings of the 17th Conference on Ph.D Research in Microelectronics and Electronics, 2022

2017

Non-homogenous gamma process: Application to SiC MOSFET threshold voltage instability.

Thomas Santini, Sébastien Morand, Mitra Fouladirad, Florent Miller, Antoine Grall, Bruno Allard

Microelectron. Reliab., 2017

2015

Prediction of proton cross sections for SEU in SRAMs and SDRAMs using the METIS engineer tool.

Cécile Weulersse, Florent Miller, Thierry Carrière, R. Mangeret

Microelectron. Reliab., 2015

2014

Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment.

Thomas Santini, Sébastien Morand, Mitra Fouladirad, Luong-Viêt Phung, Florent Miller, Bruno Foucher, Antoine Grall, Bruno Allard

Microelectron. Reliab., 2014

2012

Test methodology of a new upset mechanism induced by protons in deep sub-micron devices.

Cécile Weulersse, Florent Miller, Dan Alexandrescu, Erwin Schaefer, Olivier Crépel, Rémi Gaillard

Microelectron. Reliab., 2012

2009

Novel DRAM mitigation technique.

Antonin Bougerol, Florent Miller, Nadine Buard

Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

2008

SDRAM Architecture & Single Event Effects Revealed with Laser.

Antonin Bougerol, Florent Miller, Nadine Buard

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

2007

Latchup effect in CMOS IC: a solution for crypto-processors protection against fault injection attacks?

Nadine Buard, Florent Miller, Cédric Ruby, Rémi Gaillard

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

2006

Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells.

Guillaume Hubert, Antonin Bougerol, Florent Miller, Nadine Buard, Lorena Anghel, Thierry Carrière, Frederic Wrobel, Rémi Gaillard

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006