Frédéric Wrobel

According to our database, Frédéric Wrobel authored at least 23 papers between 2005 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2023

A Detailed Electrical Analysis of SEE on 28 nm FDSOI SRAM Architectures.

Cleiton Magano Marques, Leonardo Heitich Brendler, Frédéric Wrobel, Alexandra L. Zimpeck, Walter E. Calienes Bartra, Paulo F. Butzen, Cristina Meinhardt

Proceedings of the 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2023

2022

Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices.

Lucas Matana Luza, Frederic Wrobel, Luis Entrena, Luigi Dilillo

Proceedings of the IEEE European Test Symposium, 2022

2020

Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects.

Israel C. Lopes, Vincent Pouget, Frederic Wrobel, Frédéric Saigné, Antoine D. Touboul, Ketil Røed

Proceedings of the IEEE Latin-American Test Symposium, 2020

Evaluation and Analysis of Technologies for Robotic Platforms for the Nuclear Decommissioning.

Georgios Tsiligiannis, Antoine D. Touboul, Gaëtan Bricas, Tadec Maraine, Jerome Boch, Frederic Wrobel, Alain Michez, Frédéric Saigné, Alain Godot, Asenath Etile, Thibaud Durand, Romain Sueur, Didier Farigoule, Philippe Girones

Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020

Effect of Temperature on Single Event Latchup Sensitivity.

S. Guagliardo, Frederic Wrobel, Ygor Q. Aguiar, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul

Proceedings of the 15th Design & Technology of Integrated Systems in Nanoscale Era, 2020

2018

TCAD simulation of radiation-induced leakage current in 1T1C SDRAM.

Hoang T. Nguyen, Axel Rodriguez, Frederic Wrobel, Alain Michez, Francoise Bezerra, Nathalie Chatry, Benjamin Vandevelde

Microelectron. Reliab., 2018

Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions.

Ygor Q. Aguiar, Frederic Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Antoine D. Touboul, Vincent Pouget

Microelectron. Reliab., 2018

2017

A calculation method to estimate single event upset cross section.

Frederic Wrobel, Antoine D. Touboul, Vincent Pouget, Luigi Dilillo, Jerome Boch, Frédéric Saigné

Microelectron. Reliab., 2017

Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis.

Vincent Pouget, S. Jonathas, R. Job, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné

Microelectron. Reliab., 2017

2015

Real-time SRAM based particle detector.

Luigi Dilillo, Alexandre Bosser, Viyas Gupta, Frederic Wrobel, Frédéric Saigné

Proceedings of the 6th International Workshop on Advances in Sensors and Interfaces, 2015

2013

Characterization of an SRAM based particle detector for mixed-field radiation environments.

Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Julien Mekki, Markus Brugger, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné

Proceedings of the 5th IEEE International Workshop on Advances in Sensors and Interfaces, 2013

SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations.

Georgios Tsiligiannis, Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné

Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.

Elena I. Vatajelu, Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné

Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013

2012

On the reliability assessment of trench fieldstop IGBT under atmospheric neutron spectrum.

Antoine D. Touboul, L. Foro, Frederic Wrobel, Frédéric Saigné

Microelectron. Reliab., 2012

Evaluation of test algorithms stress effect on SRAMs under neutron radiation.

Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Antoine D. Touboul, Frederic Wrobel, Frédéric Saigné

Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012

2011

MC-ORACLE: A tool for predicting Soft Error Rate.

Frederic Wrobel, Frédéric Saigné

Comput. Phys. Commun., 2011

Neutron detection in atmospheric environment through static and dynamic SRAM-based test bench.

Luigi Dilillo, Paolo Rech, Jean-Marc Gallière, Patrick Girard, Frederic Wrobel, Frédéric Saigné

Proceedings of the 12th Latin American Test Workshop, 2011

2010

Manufacturers to end-users tools for radiations induced reliability issues in electronic devices.

Frédéric Wrobel

Proceedings of the 11th Latin American Test Workshop, 2010

2008

Detailed history of recoiling ions induced by nucleons.

Frederic Wrobel

Comput. Phys. Commun., 2008

2007

Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells.

Claudia Rusu, Antonin Bougerol, Lorena Anghel, Cécile Weulersse, Nadine Buard, S. Benhammadi, Nicolas Renaud, Guillaume Hubert, Frederic Wrobel, Thierry Carrière, Rémi Gaillard

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

2006

Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells.

Guillaume Hubert, Antonin Bougerol, Florent Miller, Nadine Buard, Lorena Anghel, Thierry Carrière, Frederic Wrobel, Rémi Gaillard

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

2005

Use of Nuclear Codes for Neutron-Induced Nuclear Reactions in Microelectronics.

Frederic Wrobel

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

A Review of DASIE Code Family: Contribution to SEU/MBU Understanding.

Guillaume Hubert, Nadine Buard, Cécile Weulersse, Thierry Carrière, Marie-Catherine Palau, Jean-Marie Palau, Damien Lambert, Jacques Baggio, Frederic Wrobel, Frédéric Saigné, Rémi Gaillard

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005