Gabriel Torrens

According to our database, Gabriel Torrens authored at least 22 papers between 2009 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

SRAM Alpha-SER Estimation From Word-Line Voltage Margin Measurements: Design Architecture and Experimental Results.

Gabriel Torrens, Ivan de Paúl, Bartomeu Alorda, Sebastia Bota, Jaume Segura

CoRR, 2024

2023

A Compact Double-Exponential Circuit for Single Event Transient Emulation.

Sebastià A. Bota, Salvador Barcelo, Gabriel Torrens, Rafel Perelló, Jaume Verd, Ivan de Paúl, Jaume Segura

Proceedings of the 38th Conference on Design of Circuits and Integrated Systems, 2023

2022

SRAM-cells Reproducibility Metrics for Physical Unclonable Function Applications.

Abdel Alheyasat, Gabriel Torrens, Sebastia Bota, Bartomeu Alorda

Proceedings of the 37th Conference on Design of Circuits and Integrated Systems, 2022

2020

Bit-Cell Selection Analysis for Embedded SRAM-Based PUF.

Abdel Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda

Proceedings of the IEEE International Symposium on Circuits and Systems, 2020

Selection of SRAM Cells to improve Reliable PUF implementation using Cell Mismatch Metric.

Abdel Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda

Proceedings of the XXXV Conference on Design of Circuits and Integrated Systems, 2020

2019

A 65-nm Reliable 6T CMOS SRAM Cell with Minimum Size Transistors.

Gabriel Torrens, Bartomeu Alorda, Cristian Carmona, Daniel Malagón-Periánez, Jaume Segura, Sebastià A. Bota

IEEE Trans. Emerg. Top. Comput., 2019

Weak and Strong SRAM cells analysis in embedded memories for PUF applications.

Abdel Alheyasat, Gabriel Torrens, Sebastià A. Bota, Bartomeu Alorda

Proceedings of the XXXIV Conference on Design of Circuits and Integrated Systems, 2019

2017

Soft error rate comparison of 6T and 8T SRAM ICs using mono-energetic proton and neutron irradiation sources.

Daniel Malagón, Sebastià A. Bota, Gabriel Torrens, Xavier Gili, Javier Praena, B. Fernández, Miguel Macías, José Manuel Quesada, Carlos Guerrero Sanchez, María del Carmen Jiménez-Ramos, Javier García López, José Luis Merino, Jaume Segura

Microelectron. Reliab., 2017

Statistical characterization and modeling of random telegraph noise effects in 65nm SRAMs cells.

Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Gabriel Torrens, Sebastià A. Bota, Jaume Segura, Francesc Moll, Antonio Rubio

Proceedings of the 14th International Conference on Synthesis, 2017

6T CMOS SRAMs reliability monitoring through stability measurements.

Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

Cantilever NEMS relay-based SRAM devices for enhanced reliability.

Sebastià A. Bota, Jaume Verd, Joan Barceló, Xavier Gili, Bartomeu Alorda, Gabriel Torrens, Carol de Benito, Jaume Segura

Proceedings of the 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2017

Evaluation of SRAM cell write margin metrics for lifetime monitoring of BTI-induced Vth drift.

Bartomeu Alorda, Gabriel Torrens

Proceedings of the 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2017

2016

An affordable experimental technique for SRAM write margin characterization for nanometer CMOS technologies.

Bartomeu Alorda, Cristian Carmona, Gabriel Torrens, Sebastià A. Bota

Microelectron. Reliab., 2016

On-line write margin estimator to monitor performance degradation in SRAM cores.

Bartomeu Alorda, Cristian Carmona, Gabriel Torrens, Sebastià A. Bota

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

2014

Adaptive static and dynamic noise margin improvement in minimum-sized 6T-SRAM cells.

Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura

Microelectron. Reliab., 2014

2013

Accurate alpha soft error rate evaluation in SRAM memories.

Sebastià A. Bota, Gabriel Torrens, Ivan de Paúl, Bartomeu Alorda, L. A. Segura

Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

2011

8T vs. 6T SRAM cell radiation robustness: A comparative analysis.

Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura

Microelectron. Reliab., 2011

Stability optimization of embedded 8T SRAMs using Word-Line Voltage modulation.

Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura

Proceedings of the Design, Automation and Test in Europe, 2011

2010

Design Hardening of Nanometer SRAMs Through Transistor Width Modulation and Multi-Vt Combination.

Gabriel Torrens, Bartomeu Alorda, Salvador Barcelo, José Luis Rosselló, Sebastià A. Bota, Jaume Segura

IEEE Trans. Circuits Syst. II Express Briefs, 2010

Cross-BIC architecture for single and multiple SEU detection enhancement in SRAM memories.

Sebastià A. Bota, Gabriel Torrens, Bartomeu Alorda, Jaume Verd, Jaume Segura

Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

Static and dynamic stability improvement strategies for 6T CMOS low-power SRAMs.

Bartomeu Alorda, Gabriel Torrens, Sebastià A. Bota, Jaume Segura

Proceedings of the Design, Automation and Test in Europe, 2010

2009

Critical charge characterization in 6-T SRAMs during read mode.

Sebastià A. Bota, Gabriel Torrens, Bartomeu Alorda

Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009