Sebastià A. Bota

Cristian Carmona

Daniel Malagón-Periánez

María del Carmen Jiménez-Ramos

IEEE Trans. Emerg. Top. Comput., 2019

Weak and Strong SRAM cells analysis in embedded memories for PUF applications.

[BibT_eX]

[DOI]

Proceedings of the XXXIV Conference on Design of Circuits and Integrated Systems, 2019

2018

Thermomechanical Noise Characterization in Fully Monolithic CMOS-MEMS Resonators.

[BibT_eX]

[DOI]

Sensors, 2018

Frequency Fluctuations in CMOS-MEMS Oscillators: Towards the Thermomechanical Limit.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

Bistability in a CMOS-MEMS Thermally Tuned Microbeam Resonator.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

2017

Soft error rate comparison of 6T and 8T SRAM ICs using mono-energetic proton and neutron irradiation sources.

[BibT_eX]

[DOI]

Carlos Guerrero Sanchez

Javier García López

José Luis Merino

Microelectron. Reliab., 2017

Statistical characterization and modeling of random telegraph noise effects in 65nm SRAMs cells.

[BibT_eX]

[DOI]

Javier Martín-Martínez

Proceedings of the 14th International Conference on Synthesis, 2017

6T CMOS SRAMs reliability monitoring through stability measurements.

[BibT_eX]

[DOI]

Gabriel Torrens

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

Cantilever NEMS relay-based SRAM devices for enhanced reliability.

[BibT_eX]

[DOI]

Proceedings of the 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2017

2016

An affordable experimental technique for SRAM write margin characterization for nanometer CMOS technologies.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2016

Electrostatically actuated microbeam resonators as chaotic signal generators: A practical perspective.

[BibT_eX]

[DOI]

Commun. Nonlinear Sci. Numer. Simul., 2016

On-line write margin estimator to monitor performance degradation in SRAM cores.

[BibT_eX]

[DOI]

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

2015

Impact of increasing the fin height on soft error rate and static noise margin in a FinFET-based SRAM cell.

[BibT_eX]

[DOI]

Proceedings of the 16th Latin-American Test Symposium, 2015

2014

Sensitization Input Vector Impact on Propagation Delay for Nanometer CMOS ICs: Analysis and Solutions.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2014

Adaptive static and dynamic noise margin improvement in minimum-sized 6T-SRAM cells.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2014

Analysis of fin height on FinFET SRAM cell hardening.

[BibT_eX]

[DOI]

Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

Word-line power supply selector for stability improvement of embedded SRAMs in high reliability applications.

[BibT_eX]

[DOI]

Cristian Carmona

Jose Luis Garcia-Gervacio

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

Alternate characterization technique for static random-access memory static noise margin determination.

[BibT_eX]

[DOI]

Int. J. Circuit Theory Appl., 2013

Bridge defect detection in nanometer CMOS circuits using Low VDD and body bias.

[BibT_eX]

[DOI]

Hector Villacorta

Víctor H. Champac

Jaime Martínez-Castillo

Proceedings of the 14th Latin American Test Workshop, 2013

Accurate alpha soft error rate evaluation in SRAM memories.

[BibT_eX]

[DOI]

Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

2012

Resistive bridge defect detection enhancement under parameter variations combining Low V<sub>DD</sub> and body bias in a delay based test.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2012

2011

8T vs. 6T SRAM cell radiation robustness: A comparative analysis.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2011

An efficient and scalable STA tool with direct path estimation and exhaustive sensitization vector exploration for optimal delay computation.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation and Test in Europe, 2011

Stability optimization of embedded 8T SRAMs using Word-Line Voltage modulation.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation and Test in Europe, 2011

2010

Application of Predictive Oscillation-Based Test to a CMOS OpAmp.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2010

Design Hardening of Nanometer SRAMs Through Transistor Width Modulation and Multi-Vt Combination.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. II Express Briefs, 2010

Cross-BIC architecture for single and multiple SEU detection enhancement in SRAM memories.

[BibT_eX]

[DOI]

Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

Static and dynamic stability improvement strategies for 6T CMOS low-power SRAMs.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation and Test in Europe, 2010

2009

Predictive test strategy for CMOS RF mixers.

[BibT_eX]

[DOI]

Eugenio García-Moreno

Integr., 2009

Predictive Test Technique for Diagnosis of RF CMOS Receivers.

[BibT_eX]

[DOI]

Eugenio García-Moreno

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Critical charge characterization in 6-T SRAMs during read mode.

[BibT_eX]

[DOI]

Gabriel Torrens

Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

2008

A simple CMOS chaotic integrated circuit.

[BibT_eX]

[DOI]

IEICE Electron. Express, 2008

2007

A Module for BiST of CMOS RF Receivers.

[BibT_eX]

[DOI]

J. Electron. Test., 2007

Heavy Ion Test Results in a CMOS triple Voting Register for a High-Energy Physics Experiment.

[BibT_eX]

[DOI]

X. Cano

Ricardo Graciani Diaz

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

Dynamic critical resistance: a timing-based critical resistance model for statistical delay testing of nanometer ICs.

[BibT_eX]

[DOI]

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2006

Force-balance interface circuit based on floating MOSFET capacitors for micro-machined capacitive accelerometers.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. II Express Briefs, 2006

Impact of Thermal Gradients on Clock Skew and Testing.

[BibT_eX]

[DOI]

IEEE Des. Test Comput., 2006

Low V_D_D vs. Delay: Is it Really a Good Correlation Metric for Nanometer ICs?.

[BibT_eX]

[DOI]

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Leakage Power Characterization Considering Process Variations.

[BibT_eX]

[DOI]

Proceedings of the Integrated Circuit and System Design. Power and Timing Modeling, 2006

A Fully CMOS Low-Cost Chaotic Neural Network.

[BibT_eX]

[DOI]

Proceedings of the International Joint Conference on Neural Networks, 2006

2005

Compact Static Power Model of Complex CMOS Gates.

[BibT_eX]

[DOI]

José Luis Rosselló

Proceedings of the Integrated Circuit and System Design, 2005

A Non-Intrusive Built-In Sensor for Transient Current Testing of Digital VLSI Circuits.

[BibT_eX]

[DOI]

Pere Lluís Miribel-Català

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs.

[BibT_eX]

[DOI]

Proceedings of the 2005 Design, 2005

Smart Temperature Sensor for Thermal Testing of Cell-Based ICs.

[BibT_eX]

[DOI]

Proceedings of the 2005 Design, 2005

2004

A reusable smart interface for gas sensor resistance measurement.

[BibT_eX]

[DOI]

IEEE Trans. Instrum. Meas., 2004

Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism.

[BibT_eX]

[DOI]

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

A mixed-mode temperature control circuit for gas sensors.

[BibT_eX]

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

On-line Monitoring Capabilities of Oscillation Test Techniques: Results Demonstration in an OTA.

[BibT_eX]

[DOI]

Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004

2002

A miniature robot driven by smart power integrated circuits.

[BibT_eX]

[DOI]

Enric Montane

Pere Lluís Miribel-Català

Josep Samitier

Proceedings of the IEEE/RSJ International Conference on Intelligent Robots and Systems, Lausanne, Switzerland, September 30, 2002

2001

Smart Temperature Sensor for On-Line Monitoring in Automotive Applications.

[BibT_eX]

[DOI]

Proceedings of the 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 2001

SPU based microrobots: a new approach to the robotic world.

[BibT_eX]

[DOI]

Enric Montane

Manel Puig-Vidal

Jaime López-Sánchez

Pedro Lluís Miribel-Català

Josep Samitier

Proceedings of the 2001 8th IEEE International Conference on Electronics, 2001

High accuracy piezoelectric-based microrobot for biomedical applications.

[BibT_eX]

[DOI]

Jaime López-Sánchez

Proceedings of 8th IEEE International Conference on Emerging Technologies and Factory Automation, 2001

1999

A MOSFET-only second order delta-sigma modulator for capacitive sensor interfaces.

[BibT_eX]

[DOI]

Jose Maria Gómez Cama