Renaud Gillon

According to our database1, Renaud Gillon authored at least 23 papers between 2001 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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In proceedings 
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PhD thesis 
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Online presence:

On csauthors.net:

Bibliography

2022
Investigation on Realistic Stuck-on/off Defects to Complement IEEE P2427 Draft Standard.
Proceedings of the 23rd International Symposium on Quality Electronic Design, 2022

2019
Design and Characterization of Bias Tee Used for S-parameter Characterization of Power Inductors.
Proceedings of the 42nd International Convention on Information and Communication Technology, 2019

2017
An Extended Analytic Model for the Heating of Bondwires.
CoRR, 2017

2016
Electrothermal simulation of bonding wire degradation under uncertain geometries.
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

Model Order Reduction for nanoelectronics coupled problems with many inputs.
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

2015
Addressing the Smart Systems design challenge: The SMAC platform.
Microprocess. Microsystems, 2015

SPICE analysis of RL and RC snubber circuits for synchronous buck DC-DC converters.
Proceedings of the 38th International Convention on Information and Communication Technology, 2015

3D EM simulations and analysis of in-package metal plate interconnecting high-side and low-side FETs of DC-DC converter.
Proceedings of the 2015 IEEE International Conference on Electronics, 2015

DC/DC converter dead-time variation analysis and far-field radiation estimation.
Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015

Radiation characteristics of small loop antenna above perforated finite image plane.
Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015

2014
Automatic generation of electro-thermal models with TRAPPIST.
Proceedings of the 21st IEEE International Conference on Electronics, Circuits and Systems, 2014

Multi-domain simulation as a foundation for the engineering of smart systems: Challenges and the SMAC vision.
Proceedings of the 21st IEEE International Conference on Electronics, Circuits and Systems, 2014

2013
IC-Stripline design optimization using response surface methodology.
Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013

Broadband detection of radiating moments using the TEM-cell and a phase-calibrated oscilloscope.
Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013

SMAC: Smart Systems Co-design.
Proceedings of the 2013 Euromicro Conference on Digital System Design, 2013

2012
Comparison of experimental methods for the extraction of the elastic modulus of molding compounds used in IC packaging.
Microelectron. Reliab., 2012

Electro-thermal characterization and simulation of integrated multi-trenched XtreMOS<sup>TM</sup> power devices.
Microelectron. J., 2012

2010
Investigation of smart power DMOS devices under repetitive stress conditions using transient thermal mapping and numerical simulation.
Microelectron. Reliab., 2010

2009
Equivalent circuit model of the TEM cell electric and magnetic field coupling to microstrip lines.
Proceedings of the 16th IEEE International Conference on Electronics, 2009

2008
Next Generation Smart Power Technologies - Challenges and Innovations Enabling Complex SoC Integration.
Proceedings of the 2008 IEEE International Solid-State Circuits Conference, 2008

2007
A New Charge based Compact Model for Lateral Asymmetric MOSFET and its application to High Voltage MOSFET Modeling.
Proceedings of the 20th International Conference on VLSI Design (VLSI Design 2007), 2007

2006
A Compact DC and AC Model for Circuit Simulation of High Voltage VDMOS Transistor.
Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006

2001
A compact test structure for characterisation of leakage currents in sub-micron CMOS technologies.
Microelectron. Reliab., 2001


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