Hao Yan
Orcid: 0000-0002-5312-4483Affiliations:
- Southeast University, National ASIC Center, Nanjing, China
According to our database1,
Hao Yan
authored at least 21 papers
between 2019 and 2024.
Collaborative distances:
Collaborative distances:
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
Online presence:
-
on orcid.org
On csauthors.net:
Bibliography
2024
IEEE Trans. Circuits Syst. II Express Briefs, January, 2024
2023
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., December, 2023
Optimized matrix ordering of sparse linear solver using a few-shot model for circuit simulation.
Integr., November, 2023
CharTM: The dynamic stability characterization for memory based on tail distribution modeling.
Microelectron. J., March, 2023
An efficient SRAM yield analysis method based on scaled-sigma adaptive importance sampling with meta-model accelerated.
Integr., March, 2023
IEEE Des. Test, February, 2023
Proceedings of the Great Lakes Symposium on VLSI 2023, 2023
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023
Graph-Learning-Driven Path-Based Timing Analysis Results Predictor from Graph-Based Timing Analysis.
Proceedings of the 28th Asia and South Pacific Design Automation Conference, 2023
Proceedings of the 15th IEEE International Conference on ASIC, 2023
2022
A Compact High-Dimensional Yield Analysis Method using Low-Rank Tensor Approximation.
ACM Trans. Design Autom. Electr. Syst., 2022
IEEE Trans. Circuits Syst. II Express Briefs, 2022
IEEE Trans. Circuits Syst. I Regul. Pap., 2022
2021
Proceedings of the ASPDAC '21: 26th Asia and South Pacific Design Automation Conference, 2021
2020
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
A Non-Gaussian Adaptive Importance Sampling Method for High-Dimensional and Multi-Failure-Region Yield Analysis.
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2020
2019
Adaptive Clustering and Sampling for High-Dimensional and Multi-Failure-Region SRAM Yield Analysis.
Proceedings of the 2019 International Symposium on Physical Design, 2019
Efficient Yield Analysis for SRAM and Analog Circuits using Meta-Model based Importance Sampling Method.
Proceedings of the International Conference on Computer-Aided Design, 2019
Meta-Model based High-Dimensional Yield Analysis using Low-Rank Tensor Approximation.
Proceedings of the 56th Annual Design Automation Conference 2019, 2019
Adaptive Low-Rank Tensor Approximation for SRAM Yield Analysis using Bootstrap Resampling.
Proceedings of the 13th IEEE International Conference on ASIC, 2019