Hongxi Liu
Orcid: 0009-0004-1562-2539
According to our database1,
Hongxi Liu
authored at least 20 papers
between 2022 and 2025.
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Bibliography
2025
A Novel Links Fault Tolerant Analysis: $g$-Good $r$-Component Edge-Connectivity of Interconnection Networks With Applications to Hypercubes.
IEEE Trans. Reliab., March, 2025
Design of a Reconfigurable Sensor Array for Localization of Magnetic Capsule Endoscope.
IEEE Trans. Instrum. Meas., 2025
Edge isoperimetric method: At least 2/3 of h-extra edge-connectivity of a kind of cube-based graphs concentrates on 2n-1.
Discret. Appl. Math., 2025
Thermal-Compensated MRAM Sensing: Dynamic TMR Stabilization Across Wide Temperature Range.
Proceedings of the 14th International Conference on Modern Circuits and Systems Technologies, 2025
2024
J. Supercomput., May, 2024
Comparative Validation and Misclassification Diagnosis of 30-Meter Land Cover Datasets in China.
Remote. Sens., 2024
The edge fault-tolerance about the strong Menger edge-connectivity of order r among hamming graph.
Discret. Appl. Math., 2024
Spin-orbit torque efficiency enhancement to tungsten-based SOT-MTJs by interface modification with an ultrathin MgO.
Sci. China Inf. Sci., 2024
Process optimization and cryogenic evaluation of spin-orbit torque magnetic random access memory.
Proceedings of the IEEE International Memory Workshop, 2024
Series-Parallel Hybrid SOT-MRAM Computing-in-Memory Macro with Multi-Method Modulation for High Area and Energy Efficiency.
Proceedings of the 61st ACM/IEEE Design Automation Conference, 2024
Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2024
2023
HSGNet: hierarchically stacked graph network with attention mechanism for 3D human pose estimation.
Multim. Syst., August, 2023
Appl. Soft Comput., June, 2023
Many-to-many edge-disjoint paths in (<i>n</i>,<i>k</i>)-enhanced hypercube under three link-faulty hypotheses.
Theor. Comput. Sci., May, 2023
Embedded Edge-Connectivity Reliability Evaluation of Augmented Hypercube Interconnection Networks.
Int. J. Found. Comput. Sci., January, 2023
J. Electronic Imaging, 2023
IEEE Access, 2023
Full reliability characterization of three-terminal SOT-MTJ devices and corresponding arrays.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
A unified approach to reliability and edge fault tolerance of cube-based interconnection networks under three hypotheses.
J. Supercomput., 2022