Sungyoul Seo

Orcid: 0000-0001-9469-758X

According to our database¹, Sungyoul Seo authored at least 13 papers between 2015 and 2022.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

Timeline

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On csauthors.net:

Bibliography

2022

Reduced-Pin-Count BOST for Test-Cost Reduction.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

2019

An Efficient BIRA Utilizing Characteristics of Spare Pivot Faults.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019

2018

A Statistic-Based Scan Chain Reordering for Energy-Quality Scalable Scan Test.

[BibT_eX]

[DOI]

IEEE J. Emerg. Sel. Topics Circuits Syst., 2018

2-D Failure Bitmap Compression Using Line Fault Marking Method.

[BibT_eX]

[DOI]

Proceedings of the International SoC Design Conference, 2018

2017

Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder.

[BibT_eX]

[DOI]

Proceedings of the 18th International Symposium on Quality Electronic Design, 2017

Broadcast scan compression based on deterministic pattern generation algorithm.

[BibT_eX]

[DOI]

Proceedings of the 18th International Symposium on Quality Electronic Design, 2017

An efficient built-in self-repair scheme for area reduction.

[BibT_eX]

[DOI]

Proceedings of the International SoC Design Conference, 2017

2016

Tri-State Coding Using Reconfiguration of Twisted Ring Counter for Test Data Compression.

[BibT_eX]

[DOI]

Sungyoul Seo

Yong Lee

Sungho Kang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

A test methodology to screen scan-path failures.

[BibT_eX]

[DOI]

Proceedings of the International SoC Design Conference, 2016

Software-based embedded core test using multi-polynomial for test data reduction.

[BibT_eX]

[DOI]

Proceedings of the International SoC Design Conference, 2016

2015

A scan shifting method based on clock gating of multiple groups for low power scan testing.

[BibT_eX]

[DOI]

Proceedings of the Sixteenth International Symposium on Quality Electronic Design, 2015

Low power scan bypass technique with test data reduction.

[BibT_eX]

[DOI]

Proceedings of the Sixteenth International Symposium on Quality Electronic Design, 2015

Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction.

[BibT_eX]

[DOI]

Proceedings of the 24th IEEE Asian Test Symposium, 2015

Sungyoul Seo

Timeline

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