J. Heitmann
According to our database1,
J. Heitmann
authored at least 2 papers
in 2022.
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Bibliography
2022
Reliability of Ferroelectric and Antiferroelectric Si: HfO2 materials in 3D capacitors by TDDB studies.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Endurance improvements and defect characterization in ferroelectric FETs through interface fluorination.
Proceedings of the IEEE International Memory Workshop, 2022