Yannick Raffel
Orcid: 0000-0001-8629-5206
According to our database1,
Yannick Raffel
authored at least 8 papers
between 2021 and 2023.
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Bibliography
2023
Demonstration of Differential Mode Ferroelectric Field-Effect Transistor Array-Based in-Memory Computing Macro for Realizing Multiprecision Mixed-Signal Artificial Intelligence Accelerator.
Adv. Intell. Syst., June, 2023
Proceedings of the IEEE International Memory Workshop, 2023
Reconfigurable ferroelectric hafnium oxide FeFET fabricated in 28 nm CMOS technology for mmWave applications.
Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023
2022
Proceedings of the 19th International SoC Design Conference, 2022
Impact of Temperature on Reliability of MFIS HZO-based Ferroelectric Tunnel Junctions.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Endurance improvements and defect characterization in ferroelectric FETs through interface fluorination.
Proceedings of the IEEE International Memory Workshop, 2022
Interfacial Layer Engineering to Enhance Noise Immunity of FeFETs for IMC Applications.
Proceedings of the International Conference on IC Design and Technology, 2022
2021
Comparison of Analog and Noise Performance between Buried Channel versus Surface Devices in HKMG I/O Devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2021