James Palmer

According to our database, James Palmer authored at least 6 papers between 2018 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Reliability Modeling of Middle-Of-Line Interconnect Dielectrics in Advanced process nodes.

Rahim Kasim, Cheyun Lin, Christopher Perini, James Palmer, N. Gilda, S. Imam, Justin R. Weber, C. Wallace, Jeffery Hicks

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2021

Customized Parallel Reliability Testing Platform with Multifold Throughput Enhancement for Intel Stressing Tests.

Peng Xiao, Haris Hadziosmanovic, Michael Klessens, Rong Jiang, John Ortega, Daniel Schroeder, James Palmer, Ilan Tsameret

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Intrinsic Reliability of BEOL interlayer dielectric.

James Palmer, Galor Zhang, Justin R. Weber, Cheyun Lin, Christopher Perini, Rahim Kasim

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Reliability Characterization for 12 V Application Using the 22FFL FinFET Technology.

Chen-Yi Su, Mark Armstrong, Sunny Chugh, Mohammed El-tanani, Hannes Greve, Hai Li, Mahjabin Maksud, Benjamin Orr, Christopher Perini, James Palmer, Leif Paulson, Stephen Ramey, James Waldemer, Yang Yang, Dave Young

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

A Reliability Overview of Intel's 10+ Logic Technology.

Rohit Grover, Tony Acosta, C. AnDyke, Emre Armagan, C. Auth, Sunny Chugh, K. Downes, M. Hattendorf, N. Jack, S. Joshi, R. Kasim, Gerald S. Leatherman, S.-H. Lee, C.-Y. Lin, A. Madhavan, H. Mao, A. Lowrie, G. Martin, G. McPherson, Pinakpani Nayak, Adam Neale, D. Nminibapiel, Benjamin Orr, James Palmer, C. M. Pelto, S. S. Poon, I. Post, Tanmoy Pramanik, Anisur Rahman, Stephen Ramey, Norbert Seifert, K. Sethi, Anthony Schmitz, H. Wu, A. Yeoh

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018

Reliability of dual-damascene local interconnects featuring cobalt on 10 nm logic technology.

F. Griggio, James Palmer, F. Pan, N. Toledo, Anthony Schmitz, Ilan Tsameret, R. Kasim, Gerald S. Leatherman, Jeffery Hicks, A. Madhavan, J. Shin, J. Steigerwald, A. Yeoh, C. Auth

Proceedings of the IEEE International Reliability Physics Symposium, 2018