Stephen Ramey

According to our database, Stephen Ramey authored at least 13 papers between 2015 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

A Unified Aging Model Framework Capturing Device to Circuit Degradation for Advance Technology Nodes.

S. Mukhopadhyay, C. Chen, M. Jamil, Jihan Standfest, Inanc Meric, Balkaran Gill, Stephen Ramey

Proceedings of the IEEE International Reliability Physics Symposium, 2023

A detailed comparison of various off-state breakdown methodologies for scaled Tri-gate technologies.

K. Joshi, D. Nminibapiel, M. Ghoneim, D. Ali, R. Ramamurthy, L. Pantisano, Inanc Meric, Stephen Ramey

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS Technology.

M. Jamil, S. Mukhopadhay, M. Ghoneim, A. Shailos, Chetan Prasad, Inanc Meric, Stephen Ramey

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Method to evaluate off-state breakdown in scaled Tri-gate technologies.

D. Nminibapiel, K. Joshi, R. Ramamurthy, L. Pantisano, Inanc Meric, Stephen Ramey

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2020

Reliability Stressing Control Using Jacobian Feedback Kelvin Measurement on Intel Technologies.

Peng Xiao, Haris Hadziosmanovic, Rong Jiang, Misagh Rostami-asrabad, Stephen Ramey, Ilan Tsamaret

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits.

Ketul B. Sutaria, Jihan Standfest, Inanc Meric, Amirhossein H. Davoody, Swaroop Kumar Namalapuri, Trinadh Mutyala, Supriya P., Balkaran Gill, Stephen Ramey, Jeffery Hicks

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Reliability Characterization for 12 V Application Using the 22FFL FinFET Technology.

Chen-Yi Su, Mark Armstrong, Sunny Chugh, Mohammed El-tanani, Hannes Greve, Hai Li, Mahjabin Maksud, Benjamin Orr, Christopher Perini, James Palmer, Leif Paulson, Stephen Ramey, James Waldemer, Yang Yang, Dave Young

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Modeling Framework for Transistor Aging Playback in Advanced Technology Nodes.

Inanc Meric, Stephen Ramey, Steven R. Novak, S. Gupta, S. P. Mudanai, Jeffrey Hicks

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

A Reliability Overview of Intel's 10+ Logic Technology.

Rohit Grover, Tony Acosta, C. AnDyke, Emre Armagan, C. Auth, Sunny Chugh, K. Downes, M. Hattendorf, N. Jack, S. Joshi, R. Kasim, Gerald S. Leatherman, S.-H. Lee, C.-Y. Lin, A. Madhavan, H. Mao, A. Lowrie, G. Martin, G. McPherson, Pinakpani Nayak, A. Neale, D. Nminibapiel, Benjamin Orr, James Palmer, C. M. Pelto, S. S. Poon, I. Post, Tanmoy Pramanik, Anisur Rahman, Stephen Ramey, N. Seifert, K. Sethi, Anthony Schmitz, H. Wu, A. Yeoh

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018

Transistor reliability characterization and modeling of the 22FFL FinFET technology.

Chen-Yi Su, M. Armstrong, Lei Jiang, S. A. Kumar, C. D. Landon, S. Liu, Inanc Meric, K. W. Park, Leif Paulson, K. Phoa, Bernhard Sell, Jihan Standfest, Ketul B. Sutaria, J. Wan, D. Young, Stephen Ramey

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Reliability studies of a 10nm high-performance and low-power CMOS technology featuring 3rd generation FinFET and 5th generation HK/MG.

Anisur Rahman, Javier Dacuña, Pinakpani Nayak, Gerald S. Leatherman, Stephen Ramey

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015

Transistor reliability variation correlation to threshold voltage.

Stephen Ramey, M. Chahal, P. Nayak, Steven R. Novak, Chetan Prasad, Jeffery Hicks

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Transistor aging and reliability in 14nm tri-gate technology.

Steven R. Novak, C. Parker, D. Becher, M. Liu, Marty Agostinelli, M. Chahal, P. Packan, P. Nayak, Stephen Ramey, S. Natarajan

Proceedings of the IEEE International Reliability Physics Symposium, 2015