Jason P. Campbell

According to our database, Jason P. Campbell authored at least 4 papers between 2011 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2020

Memory update characteristics of carbon nanotube memristors (NRAM^®) under circuitry-relevant operation conditions.

Dmitry Veksler, Gennadi Bersuker, Adam W. Bushmaker, Maribeth Mason, P. R. Shrestha, Kin P. Cheung, Jason P. Campbell, Thomas Rueckes, Lee Cleveland, Harry Luan, David C. Gilmer

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Switching Variability Factors in Compliance-Free Metal Oxide RRAM.

Dmitry Veksler, Gennadi Bersuker, Adam W. Bushmaker, P. R. Shrestha, Kin P. Cheung, Jason P. Campbell

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Non-tunneling origin of the 1/f noise in SiC MOSFET.

Kin P. Cheung, Jason P. Campbell

Proceedings of the 2018 International Conference on IC Design & Technology, 2018

2011

Circuit-aware device reliability criteria methodology.

Jason T. Ryan, Lan Wei, Jason P. Campbell, Ricki G. Southwick, Kin P. Cheung, Anthony S. Oates, H.-S. Philip Wong, John Suehle

Proceedings of the 37th European Solid-State Circuits Conference, 2011