Jean Michel Daga

According to our database1, Jean Michel Daga authored at least 20 papers between 1995 and 2010.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2010
A statistical design method for Giga Bit memory arrays and beyond.
Proceedings of the 17th IEEE International Conference on Electronics, 2010

2009
A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection and Faulty Behavior Prediction in eFlash.
J. Electron. Test., 2009

2008
Hierarchical Code Correction and Reliability Management in Embedded nor Flash Memories.
Proceedings of the 13th European Test Symposium, 2008

2007
Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window.
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

A concurrent approach for testing address decoder faults in eFlash memories.
Proceedings of the 2007 IEEE International Test Conference, 2007

Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories.
Proceedings of the 12th European Test Symposium, 2007

Architecture for Highly Reliable Embedded Flash Memories.
Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), 2007

Evaluation of design for reliability techniques in embedded flash memories.
Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007

2006
An Overview of Failure Mechanisms in Embedded Flash Memories.
Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

2005
A PMOS-switch based charge pump, allowing lost cost implementation on a CMOS standard process.
Proceedings of the 31st European Solid-State Circuits Conference, 2005

2004
Embedded EEPROM Speed Optimization Using System Power Supply Resources.
Proceedings of the Integrated Circuit and System Design, 2004

2003
Design Techniques for EEPROMs Embedded in Portable Systems on Chips.
IEEE Des. Test Comput., 2003

A 40ns Random Access Time Low Voltage 2Mbits EEPROM Memory for Embedded Applications.
Proceedings of the 11th IEEE International Workshop on Memory Technology, 2003

2002
A New Single Ended Sense Amplifier for Low Voltage Embedded EEPROM Non Volatile Memories.
Proceedings of the 10th IEEE International Workshop on Memory Technology, 2002

Test and Repair of Embedded Flash Memories.
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2000
Design Techniques for Embedded EEPROM Memories in Portable ASIC and ASSP Solutions.
Proceedings of the 8th IEEE International Workshop on Memory Technology, 2000

1999
A comprehensive delay macro modeling for submicrometer CMOS logics.
IEEE J. Solid State Circuits, 1999

1998
Temperature Effect on Delay for Low Voltage Applications.
Proceedings of the 1998 Design, 1998

1997
Internal power modelling and minimization in CMOS inverters.
Proceedings of the European Design and Test Conference, 1997

1995
Delay modelling improvement for low voltage applications.
Proceedings of the Proceedings EURO-DAC'95, 1995


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