Jean-Michel Rampnoux

According to our database, Jean-Michel Rampnoux authored at least 5 papers between 2003 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

Joule expansion imaging techniques on microlectronic devices.

Stéphane Grauby, Luis David Patiño Lopez, M. Amine Salhi, Etienne Puyoo, Jean-Michel Rampnoux, Wilfrid Claeys, Stefan Dilhaire

Microelectron. J., 2009

2008

Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers.

Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire

Proceedings of the 13th European Test Symposium, 2008

2006

Time gating imaging through thick silicon substrate: a new step towards backside characterisation.

Jean-Michel Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire

Microelectron. Reliab., 2006

2004

Applications of temperature phase measurements to IC testing.

Josep Altet, Jean-Michel Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby

Microelectron. Reliab., 2004

2003

Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits.

G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys

Microelectron. Reliab., 2003