Joosung Kim
According to our database1,
Joosung Kim
authored at least 3 papers
between 2013 and 2025.
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Bibliography
2025
Introduction to Voltage-Ramping Wafer Level Electromigration Method and Current Exponent Correction Factor for Co-Capping Metal Lines.
Proceedings of the IEEE International Reliability Physics Symposium, 2025
2020
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2013
High optical density and low dielectric constant black matrix containing graphene oxide and carbon black on color filters.
Displays, 2013