Julio César Vázquez

According to our database, Julio César Vázquez authored at least 8 papers between 2009 and 2013.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2013

Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion.

Julio César Vázquez, Víctor H. Champac, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira

J. Electron. Test., 2013

2012

Aging-Aware Power or Frequency Tuning With Predictive Fault Detection.

Jackson Pachito, Celestino V. Martins, Bruno Jacinto, Jorge Semião, Julio César Vázquez, Víctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira

IEEE Des. Test Comput., 2012

2011

Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors.

Celestino V. Martins, Jorge Semião, Julio César Vázquez, Víctor H. Champac, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

2010

Low-sensitivity to process variations aging sensor for automotive safety-critical applications.

Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel Maria Cacho Teixeira, Marcelino B. Santos, João Paulo Teixeira

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

Predictive error detection by on-line aging monitoring.

Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira

Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

Programmable aging sensor for automotive safety-critical applications.

Julio César Vázquez, Víctor H. Champac, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira

Proceedings of the Design, Automation and Test in Europe, 2010

2009

Stuck-Open Fault Leakage and Testing in Nanometer Technologies.

Julio César Vázquez, Víctor H. Champac, Chuck Hawkins, Jaume Segura

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Built-in aging monitoring for safety-critical applications.

Julio César Vázquez, Víctor H. Champac, Adriel Ziesemer, Ricardo Reis, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira

Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009