Jun Luo

Orcid: 0000-0002-5122-6806

Affiliations:
  • Chinese Academy of Sciences, Institute of Microelectronics, Beijing, China


According to our database1, Jun Luo authored at least 4 papers between 2015 and 2020.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2020
An Improved Dimensional Measurement Method of Staircase Patterns With Higher Precision in 3D NAND.
IEEE Access, 2020

2016
Electromagnetic susceptibility characterization of double SOI device.
Microelectron. Reliab., 2016

2015
Simulation analysis of nanopore performance in single-nanoparticle detection.
Proceedings of the 10th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, 2015

Comparison of decoupling resistors and capacitors for increasing the single event upset resistance of SRAM cells.
Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015


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