Zongliang Huo

Orcid: 0000-0002-9845-5649

According to our database¹, Zongliang Huo authored at least 25 papers between 2015 and 2023.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

Timeline

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On csauthors.net:

Bibliography

2023

Interleaved LDPC Decoding Scheme Improves 3-D TLC NAND Flash Memory System Performance.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., November, 2023

LIAD: A Method for Extending the Effective Time of 3-D TLC NAND Flash Hard Decision.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., May, 2023

FBEL: Enhanced LLR optimization algorithm based on the VSER prediction by flag bits in the bit-flipping scheme.

[BibT_eX]

[DOI]

IEICE Electron. Express, 2023

2022

A novel adaptive-refresh scheme to reduce refresh with page endurance variance in 3D TLC NAND flash memories.

[BibT_eX]

[DOI]

IEICE Electron. Express, 2022

A polynomial based valley search algorithm for 3D NAND flash memory.

[BibT_eX]

[DOI]

IEICE Electron. Express, 2022

Gradual Channel Estimation Method for TLC NAND Flash Memory.

[BibT_eX]

[DOI]

IEEE Embed. Syst. Lett., 2022

Reduce Refresh Operations on 3-D TLC nand Flash System via Wordline (WL) Interference.

[BibT_eX]

[DOI]

IEEE Embed. Syst. Lett., 2022

Unleash Scaling Potential of 3D NAND with Innovative Xtacking® Architecture.

[BibT_eX]

[DOI]

Zongliang Huo

Weihua Cheng

Simon Yang

Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022

2021

A Small Ripple and High-Efficiency Wordline Voltage Generator for 3-D nand Flash Memories.

[BibT_eX]

[DOI]

IEEE Trans. Very Large Scale Integr. Syst., 2021

Low Power Program Scheme With Capacitance-Less Charge Recycling for 3D NAND Flash Memory.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. II Express Briefs, 2021

Efficient Data Recovery Technique for 3D TLC NAND Flash Memory based on WL Interference.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Using Word Line (WL) Interference to Reduce Refresh Operations on 3D NAND Flash System.

[BibT_eX]

[DOI]

Proceedings of the 2021 IEEE International Conference on Integrated Circuits, 2021

LAEPS: LDPC LLR Adaptive Estimation Based on Pattern Set Distribution Variation in 3D Charge Trap NAND Flash Memories.

[BibT_eX]

[DOI]

Proceedings of the 2021 IEEE International Conference on Integrated Circuits, 2021

2020

A Small Ripple Program Voltage Generator Without High-Voltage Regulator for 3D NAND Flash.

[BibT_eX]

[DOI]

IEEE Trans. Circuits Syst. II Express Briefs, 2020

Multi-Coding ECC Algorithm Based on 3D Charge Trap NAND Flash Hot Region Cell Prediction.

[BibT_eX]

[DOI]

IEEE Commun. Lett., 2020

An Improved Dimensional Measurement Method of Staircase Patterns With Higher Precision in 3D NAND.

[BibT_eX]

[DOI]

IEEE Access, 2020

Adaptive Pulse Program Scheme to Improve the Vth Distribution for 3D NAND Flash.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Circuits and Systems, 2020

2019

Cycling Induced Trap Generation and Recovery Near the Top Select Gate Transistor in 3D NAND.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Word line interference based data recovery technique for 3D NAND Flash.

[BibT_eX]

[DOI]

IEICE Electron. Express, 2018

A fast read retry method for 3D NAND flash memories using novel valley search algorithm.

[BibT_eX]

[DOI]

IEICE Electron. Express, 2018

2017

Dynamic LLR scheme based on EM algorithm for LDPC decoding in NAND flash memory.

[BibT_eX]

[DOI]

IEICE Electron. Express, 2017

A 1.2 mV ripple, 4.5 V charge pump using controllable pumping current technology.

[BibT_eX]

[DOI]

IEICE Electron. Express, 2017

2015

A 1G-cell floating-gate NOR flash memory in 65 nm technology with 100 ns random access time.

[BibT_eX]

[DOI]

Sci. China Inf. Sci., 2015

A novel adaptive CMOS low-dropout regulator with 3A sink/source capability.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015

A high efficiency all-PMOS charge pump for 3D NAND flash memory.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015

Zongliang Huo

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