Kunyang Liu

According to our database, Kunyang Liu authored at least 13 papers between 2018 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

A 0.116 pJ/bit Latch-Based True Random Number Generator Featuring Static Inverter Selection and Noise Enhancement.

Xingyu Wang, Ruilin Zhang, Kunyang Liu, Hirofumi Shinohara

IEEE Trans. Very Large Scale Integr. Syst., March, 2024

2023

Practical Markov Chain and Von Neumann based Post-processing Circuits for True Random Number Generators.

Ruilin Zhang, Haochen Zhang, Xingyu Wang, Ziyang Ye, Kunyang Liu, Hirofumi Shinohara

Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023

A 100-Bit-Output Modeling Attack-Resistant SPN Strong PUF with Uniform and High-Randomness Response.

Kunyang Liu, Yichen Tang, Shufan Xu, Ruilin Zhang, Hirofumi Shinohara

Proceedings of the IEEE Custom Integrated Circuits Conference, 2023

2022

A 0.186-pJ per Bit Latch-Based True Random Number Generator Featuring Mismatch Compensation and Random Noise Enhancement.

Ruilin Zhang, Xingyu Wang, Kunyang Liu, Hirofumi Shinohara

IEEE J. Solid State Circuits, 2022

A 0.116pJ/bit Latch-Based True Random Number Generator with Static Inverter Selection and Noise Enhancement.

Xingyu Wang, Ruilin Zhang, Yuxin Wang, Kunyang Liu, Xuanzhen Wang, Hirofumi Shinohara

Proceedings of the 2022 International Symposium on VLSI Design, Automation and Test, 2022

A 2.17-pJ/b 5b-Response Attack-Resistant Strong PUF with Enhanced Statistical Performance.

Kunyang Liu, Gen Li, Zihan Fu, Xuanzhen Wang, Hirofumi Shinohara

Proceedings of the 48th IEEE European Solid State Circuits Conference, 2022

2021

A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement.

Kunyang Liu, Xinpeng Chen, Hongliang Pu, Hirofumi Shinohara

IEEE J. Solid State Circuits, 2021

A 0.186-pJ per Bit Latch-Based True Random Number Generator with Mismatch Compensation and Random Noise Enhancement.

Ruilin Zhang, Xingyu Wang, Luying Wang, Xinpeng Chen, Fan Yang, Kunyang Liu, Hirofumi Shinohara

Proceedings of the 2021 Symposium on VLSI Circuits, Kyoto, Japan, June 13-19, 2021, 2021

36.3 A Modeling Attack Resilient Strong PUF with Feedback-SPN Structure Having <0.73% Bit Error Rate Through In-Cell Hot-Carrier Injection Burn-In.

Kunyang Liu, Zihan Fu, Gen Li, Hongliang Pu, Zhibo Guan, Xingyu Wang, Xinpeng Chen, Hirofumi Shinohara

Proceedings of the IEEE International Solid-State Circuits Conference, 2021

2020

A 373-F² 0.21%-Native-BER EE SRAM Physically Unclonable Function With 2-D Power-Gated Bit Cells and ${V}_{\text{SS}}$ Bias-Based Dark-Bit Detection.

Kunyang Liu, Yue Min, Xuan Yang, Hanfeng Sun, Hirofumi Shinohara

IEEE J. Solid State Circuits, 2020

An Inverter-Based True Random Number Generator with 4-bit Von-Neumann Post-Processing Circuit.

Xingyu Wang, Hongjie Liu, Ruilin Zhang, Kunyang Liu, Hirofumi Shinohara

Proceedings of the 63rd IEEE International Midwest Symposium on Circuits and Systems, 2020

A 0.5-V 2.07-fJ/b 497-F² EE/CMOS Hybrid SRAM Physically Unclonable Function with < 1E-7 Bit Error Rate Achieved through Hot Carrier Injection Burn-in.

Kunyang Liu, Hongliang Pu, Hirofumi Shinohara

Proceedings of the 2020 IEEE Custom Integrated Circuits Conference, 2020

2018

A 373 F² 2D Power-Gated EE SRAM Physically Unclonable Function With Dark-Bit Detection Technique.

Kunyang Liu, Yue Min, Xuan Yang, Hanfeng Sun, Hirofumi Shinohara

Proceedings of the IEEE Asian Solid-State Circuits Conference, 2018