Lee Whetsel

According to our database, Lee Whetsel authored at least 24 papers between 1988 and 2010.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2010

Commanded Test Access Port operations.

Lee Whetsel

Proceedings of the 2011 IEEE International Test Conference, 2010

2006

A High Speed Reduced Pin Count JTAG Interface.

Lee Whetsel

Proceedings of the 2006 IEEE International Test Conference, 2006

2003

Adapting JTAG for AC Interconnect Testing.

Lee Whetsel

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices.

Rakesh N. Joshi, Kenneth L. Williams, Lee Whetsel

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Overview of the IEEE P1500 Standard.

Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Inevitable Use of TAP Domains in SOCs.

Lee Whetsel

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

An analysis of power reduction techniques in scan testing.

Jayashree Saxena, Kenneth M. Butler, Lee Whetsel

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000

Adapting scan architectures for low power operation.

Lee Whetsel

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

Towards a standard for embedded core test: an example.

Yervant Zorian, Erik Jan Marinissen, Rohit Kapur, Tony Taylor, Lee Whetsel

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

Addressable test ports an approach to testing embedded cores.

Lee Whetsel

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Core test connectivity, communication, and control.

Lee Whetsel

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

A silicon El Niño?

Lee Whetsel

IEEE Des. Test Comput., 1997

Test Access of TAP'ed & Non-TAP'ed Cores.

Lee Whetsel

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

An IEEE 1149.1-Based Test Access Architecture for ICs with Embedded Cores.

Lee Whetsel

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

Proposal to Simplify Development of a Mixed-Signal Test Standard.

Lee Whetsel

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1995

Improved Boundary Scan Design.

Lee Whetsel

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1994

Navigating Test Access in Systems.

Lee Whetsel

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

An Approach to Accelerate Scan Testing in IEEE 1149.1 Architectures.

Lee Whetsel

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1993

An IEEE 1149.1 based voltmeter/oscilloscope in a chip.

Lee Whetsel

Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993

Hierarchically Accessing 1149.1 Applications in a System Environment.

Lee Whetsel

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1992

A Proposed Method of Accessing 1149.1 in a Backplane Environment.

Lee Whetsel

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1991

An IEEE 1149.1 Based Logic/Signature Analyzer in a Chip.

Lee Whetsel

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1990

Event qualification: a gateway to at-speed system testing.

Lee Whetsel

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1988

A proposed standard test bus and boundary scan architecture.

Lee Whetsel

Proceedings of the Computer Design: VLSI in Computers and Processors, 1988