Lei Li

According to our database, Lei Li authored at least 10 papers between 2003 and 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2007

Scan-BIST based on cluster analysis and the encoding of repeating sequences.

Lei Li, Zhanglei Wang, Krishnendu Chakrabarty

ACM Trans. Design Autom. Electr. Syst., 2007

2005

Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores.

Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Shivakumar Swaminathan

Proceedings of the 18th International Conference on VLSI Design (VLSI Design 2005), 2005

Hybrid BIST Based on Repeating Sequences and Cluster Analysis.

Lei Li, Krishnendu Chakrabarty

Proceedings of the 2005 Design, 2005

Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation.

Yasumi Doi, Seiji Kajihara, Xiaoqing Wen, Lei Li, Krishnendu Chakrabarty

Proceedings of the 2005 Conference on Asia South Pacific Design Automation, 2005

2004

Test set embedding for deterministic BIST using a reconfigurable interconnection network.

Lei Li, Krishnendu Chakrabarty

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004

On Using Exponential-Golomb Codes and Subexponential Codes for System-on-a-Chip Test Data Compression.

Lei Li, Krishnendu Chakrabarty

J. Electron. Test., 2004

2003

Test data compression using dictionaries with selective entries and fixed-length indices.

Lei Li, Krishnendu Chakrabarty, Nur A. Touba

ACM Trans. Design Autom. Electr. Syst., 2003

Test Data Compression Using Dictionaries with Fixed-Length Indices.

Lei Li, Krishnendu Chakrabarty

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

Deterministic BIST Based on a Reconfigurable Interconnection Network.

Lei Li, Krishnendu Chakrabarty

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume.

Seiji Kajihara, Yasumi Doi, Lei Li, Krishnendu Chakrabarty

Proceedings of the 21st International Conference on Computer Design (ICCD 2003), 2003