Lyuan Xu

According to our database, Lyuan Xu authored at least 7 papers between 2019 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Functional alterations in bipartite network of white and grey matters during aging.

Yurui Gao, Yu Zhao, Muwei Li, Richard D. Lawless, Kurt G. Schilling, Lyuan Xu, Andrea T. Shafer, Lori L. Beason-Held, Susan M. Resnick, Baxter P. Rogers, Zhaohua Ding, Adam W. Anderson, Bennett A. Landman, John C. Gore

NeuroImage, September, 2023

Automatic preprocessing pipeline for white matter functional analyses of large-scale databases.

Yurui Gao, Dylan R. Lawless, Muwei Li, Yu Zhao, Kurt G. Schilling, Lyuan Xu, Andrea T. Shafer, Lori L. Beason-Held, Susan M. Resnick, Baxter P. Rogers, Zhaohua Ding, Adam W. Anderson, Bennett A. Landman, John C. Gore

Proceedings of the Medical Imaging 2023: Image Processing, 2023

2020

High-Current State triggered by Operating-Frequency Change.

Lyuan Xu, Jingchen Cao, Shi-Jie Wen, Rita Fung, Jamie Markevitch, Dennis R. Ball, Bharat L. Bhuva

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node.

Lyuan Xu, Jingchen Cao, John Brockman, Carlo Cazzaniga, Christopher Frost, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology.

Jingchen Cao, Lyuan Xu, Shi-Jie Wen, Rita Fung, Balaji Narasimham, Lloyd W. Massengill, Bharat L. Bhuva

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology.

Lyuan Xu, Jingchen Cao, Bharat L. Bhuva, Indranil Chatterjee, Shi-Jie Wen, Richard Wong, Lloyd W. Massengill

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies.

Jingchen Cao, Lyuan Xu, Bharat L. Bhuva, Shi-Jie Wen, Richard Wong, Balaji Narasimham, Lloyd W. Massengill

Proceedings of the IEEE International Reliability Physics Symposium, 2019