M. Blaho

According to our database, M. Blaho authored at least 5 papers between 2002 and 2005.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2005

Automated setup for thermal imaging and electrical degradation study of power DMOS devices.

Michael Heer, Viktor Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Marie Denison, Matthias Stecher, Gerhard Groos

Microelectron. Reliab., 2005

2004

Multiple-time-instant 2D thermal mapping during a single ESD event.

Viktor Dubec, Sergey Bychikhin, M. Blaho, Michael Heer, Dionyz Pogany, Marie Denison, Nils Jensen, Matthias Stecher, Gerhard Groos, Erich Gornik

Microelectron. Reliab., 2004

2003

A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress.

Viktor Dubec, Sergey Bychikhin, M. Blaho, Dionyz Pogany, Erich Gornik, J. Willemen, Ning Qu, Wolfgang Wilkening, L. Zullino, A. Andreini

Microelectron. Reliab., 2003

Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method.

M. Blaho, Dionyz Pogany, Erich Gornik, Marie Denison, Gerhard Groos, Matthias Stecher

Microelectron. Reliab., 2003

2002

Experimental and simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions.

M. Blaho, Dionyz Pogany, L. Zullino, A. Andreini, Erich Gornik

Microelectron. Reliab., 2002