Matthias Stecher

According to our database, Matthias Stecher authored at least 11 papers between 2001 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

High voltage robustness of mold compounds under different environmental conditions.

Julie Paye, Albert Claudi, Matthias Stecher

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2011

On-wafer measurement of the reverse-recovery time of integrated diodes by Transmission-Line-Pulsing (TLP).

Martin Sauter, Werner Simbürger, David Johnsson, Matthias Stecher

Microelectron. Reliab., 2011

2010

Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization.

A. Podgaynaya, Ralf Rudolf, B. Elattari, Dionyz Pogany, Erich Gornik, Matthias Stecher, Marc Strasser

Microelectron. Reliab., 2010

System ESD robustness by co-design of on-chip and on-board protection measures.

Harald Gossner, Werner Simbürger, Matthias Stecher

Microelectron. Reliab., 2010

2009

Modeling and characterization of molding compound properties during cure.

Kaspar M. B. Jansen, C. Qian, Leo J. Ernst, C. Bohm, A. Kessler, Harald Preu, Matthias Stecher

Microelectron. Reliab., 2009

Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system.

Georg Haberfehlner, Sergey Bychikhin, Viktor Dubec, Michael Heer, A. Podgaynaya, M. Pfost, Matthias Stecher, Erich Gornik, Dionyz Pogany

Microelectron. Reliab., 2009

2005

Automated setup for thermal imaging and electrical degradation study of power DMOS devices.

Michael Heer, Viktor Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Marie Denison, Matthias Stecher, Gerhard Groos

Microelectron. Reliab., 2005

2004

Multiple-time-instant 2D thermal mapping during a single ESD event.

Viktor Dubec, Sergey Bychikhin, M. Blaho, Michael Heer, Dionyz Pogany, Marie Denison, Nils Jensen, Matthias Stecher, Gerhard Groos, Erich Gornik

Microelectron. Reliab., 2004

2003

Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method.

M. Blaho, Dionyz Pogany, Erich Gornik, Marie Denison, Gerhard Groos, Matthias Stecher

Microelectron. Reliab., 2003

2001

Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology.

Harald Gossner, T. Müller-Lynch, Kai Esmark, Matthias Stecher

Microelectron. Reliab., 2001

Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures.

Sergey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, Erich Gornik, Gerhard Groos, Matthias Stecher

Microelectron. Reliab., 2001