Sergey Bychikhin

According to our database, Sergey Bychikhin authored at least 19 papers between 2001 and 2013.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2013

Statistics and localisation of vertical breakdown in AlGaN/GaN HEMTs on SiC and Si substrates for power applications.

Clément Fleury, Rimma Zhytnytska, Sergey Bychikhin, Mattia Capriotti, Oliver Hilt, Domenica Visalli, Gaudenzio Meneghesso, Enrico Zanoni, Joachim Würfl, Joff Derluyn, Gottfried Strasser, Dionyz Pogany

Microelectron. Reliab., 2013

2012

HMM-TLP correlation for system-efficient ESD design.

Guido Notermans, Sergey Bychikhin, Dionyz Pogany, David Johnsson, Dejan M. Maksimovic

Microelectron. Reliab., 2012

IV, noise and electroluminescence analysis of stress-induced percolation paths in AlGaN/GaN high electron mobility transistors.

Paul Marko, Matteo Meneghini, Sergey Bychikhin, Denis Marcon, Gaudenzio Meneghesso, Enrico Zanoni, Dionyz Pogany

Microelectron. Reliab., 2012

Electro-thermal characterization and simulation of integrated multi-trenched XtreMOS^TM power devices.

J. Rhayem, B. Besbes, Raul Blecic, Sergey Bychikhin, Georg Haberfehlner, Dionyz Pogany, B. Desoete, Renaud Gillon, Aarnout Wieers, Marnix Tack

Microelectron. J., 2012

2011

Application of transient interferometric mapping method for ESD and latch-up analysis.

Dionyz Pogany, Sergey Bychikhin, Michael Heer, W. Mamanee, Erich Gornik

Microelectron. Reliab., 2011

2010

Investigation of smart power DMOS devices under repetitive stress conditions using transient thermal mapping and numerical simulation.

Sergey Bychikhin, Georg Haberfehlner, J. Rhayem, Daniel Vanderstraeten, Renaud Gillon, Dionyz Pogany

Microelectron. Reliab., 2010

2009

Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system.

Georg Haberfehlner, Sergey Bychikhin, Viktor Dubec, Michael Heer, A. Podgaynaya, M. Pfost, Matthias Stecher, Erich Gornik, Dionyz Pogany

Microelectron. Reliab., 2009

2007

Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices.

Michael Heer, Sergey Bychikhin, W. Mamanee, Dionyz Pogany, A. Heid, P. Grombach, M. Klaussner, Winfried Soppa, Bernd Ramler

Microelectron. Reliab., 2007

Backside interferometric methods for localization of ESD-induced leakage current and metal shorts.

Viktor Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Tilo Brodbeck, Wolfgang Stadler

Microelectron. Reliab., 2007

Thermal analysis of InGaN/GaN (GaN substrate) laser diodes using transient interferometric mapping.

Sergey Bychikhin, T. Swietlik, Tadeusz Suski, Sylwester Porowski, Piotr Perlin, Dionyz Pogany

Microelectron. Reliab., 2007

2006

Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up.

Michael Heer, Viktor Dubec, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Frank, A. Konrad, J. Schulz

Microelectron. Reliab., 2006

2005

Scanning heterodyne interferometer setup for the time-resolved thermal and free-carrier mapping in semiconductor devices.

Martin Litzenberger, Christoph Furböck, Sergey Bychikhin, Dionyz Pogany, Erich Gornik

IEEE Trans. Instrum. Meas., 2005

Automated setup for thermal imaging and electrical degradation study of power DMOS devices.

Michael Heer, Viktor Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Marie Denison, Matthias Stecher, Gerhard Groos

Microelectron. Reliab., 2005

2004

Multiple-time-instant 2D thermal mapping during a single ESD event.

Viktor Dubec, Sergey Bychikhin, M. Blaho, Michael Heer, Dionyz Pogany, Marie Denison, Nils Jensen, Matthias Stecher, Gerhard Groos, Erich Gornik

Microelectron. Reliab., 2004

Transient interferometric mapping of smart power SOI ESD protection devices under TLP and vf-TLP stress.

Sergey Bychikhin, Viktor Dubec, Dionyz Pogany, Erich Gornik, M. Graf, V. Dudek, Winfried Soppa

Microelectron. Reliab., 2004

2003

A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress.

Viktor Dubec, Sergey Bychikhin, M. Blaho, Dionyz Pogany, Erich Gornik, J. Willemen, Ning Qu, Wolfgang Wilkening, L. Zullino, A. Andreini

Microelectron. Reliab., 2003

2002

Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique.

Dionyz Pogany, Ján Kuzmík, J. Darmo, Martin Litzenberger, Sergey Bychikhin, Karl Unterrainer, Z. Mozolova, S. Hascik, Tibor Lalinsky, Erich Gornik

Microelectron. Reliab., 2002

2001

Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices.

Martin Litzenberger, R. Pichler, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, Kai Esmark, Harald Gossner

Microelectron. Reliab., 2001

Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures.

Sergey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, Erich Gornik, Gerhard Groos, Matthias Stecher

Microelectron. Reliab., 2001