M. O'Brien

According to our database, M. O'Brien authored at least 3 papers between 1976 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2009

A route towards production-worthy 5 µm × 25 µm and 1 µm × 20 µm non-Bosch through-silicon-via (TSV) etch, TSV metrology, and TSV integration.

Weng Hong Teh, Raymond Caramto, Jamal Qureshi, Sitaram Arkalgud, M. O'Brien, T. Gilday, Kou Maekawa, T. Saito, Kouichi Maruyama, Thenappan Chidambaram, Wei Wang, David Marx, David Grant, Russ Dudley

Proceedings of the IEEE International Conference on 3D System Integration, 2009

2000

Efficient Full-Chip Yield Analysis Methodology for OPC-Corrected VLSI Designs.

Valery Axelrad, Nicolas B. Cobb, M. O'Brien, Thuy Do, Tom Donnelly, Yuri Granik, Emile Y. Sahouria, Victor Boksha, Artur Balasinski

Proceedings of the 1st International Symposium on Quality of Electronic Design (ISQED 2000), 2000

1976

Design considerations of a database system in a clinical network environment.

Shi-Kuo Chang, M. O'Brien, J. Read, R. Borovec, W. H. Cheng, Jyh-Sheng Ke

Proceedings of the American Federation of Information Processing Societies: 1976 National Computer Conference, 1976