Md Toufiq Hasan Anik

According to our database, Md Toufiq Hasan Anik authored at least 10 papers between 2020 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Aging-Induced Failure Prognosis via Digital Sensors.

Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi

Proceedings of the Great Lakes Symposium on VLSI 2023, 2023

2021

Detecting Failures and Attacks via Digital Sensors.

Md Toufiq Hasan Anik, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

Reducing Aging Impacts in Digital Sensors via Run-Time Calibration.

Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi

J. Electron. Test., 2021

Masked SABL: A Long Lasting Side-Channel Protection Design Methodology.

Bijan Fadaeinia, Md Toufiq Hasan Anik, Naghmeh Karimi, Amir Moradi

IEEE Access, 2021

Real-Time IC Aging Prediction via On-Chip Sensors.

Ke Huang, Md Toufiq Hasan Anik, Xinqiao Zhang, Naghmeh Karimi

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2021

Testing and Reliability Enhancement of Security Primitives.

Md Toufiq Hasan Anik, Jean-Luc Danger, Omar Diankha, Mohammad Ebrahimabadi, Christoph Frisch, Sylvain Guilley, Naghmeh Karimi, Michael Pehl, Sofiane Takarabt

Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021

On the Impact of Aging on Power Analysis Attacks Targeting Power-Equalized Cryptographic Circuits.

Md Toufiq Hasan Anik, Bijan Fadaeinia, Amir Moradi, Naghmeh Karimi

Proceedings of the ASPDAC '21: 26th Asia and South Pacific Design Automation Conference, 2021

2020

On the Effect of Aging on Digital Sensors.

Md Toufiq Hasan Anik, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi

Proceedings of the 33rd International Conference on VLSI Design and 19th International Conference on Embedded Systems, 2020

On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability.

Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Hamed Pirsiavash, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi

Proceedings of the 38th IEEE International Conference on Computer Design, 2020

Failure and Attack Detection by Digital Sensors.

Md Toufiq Hasan Anik, Rachit Saini, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi

Proceedings of the IEEE European Test Symposium, 2020