Meng-Fan Wu

According to our database, Meng-Fan Wu authored at least 11 papers between 2007 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Simple receiving scheme in 100-GHz DD OFDM RoF systems employing low-sampling-rate ADCs and digital preprocess.

Huan-Ching Liu, Chi-Hsiang Lin, Chun-Ting Lin, Chia-Chien Wei, Hou-Tzu Huang, Hsun-Hao Hsu, Meng-Fan Wu, Sien Chi

Proceedings of the Optical Fiber Communications Conference and Exhibition, 2015

W-band OFDM RoF system with simple envelope detector down-conversion.

Che-Hao Li, Meng-Fan Wu, Chi-Hsiang Lin, Chun-Ting Lin

Proceedings of the Optical Fiber Communications Conference and Exhibition, 2015

Analyses on spatiotemporal patterns of impervious surface coverage in Changsha metropolitan area.

Meng-Fan Wu, Bo Yang, Fei-Fei Hu, Liu-Wen Liao

Proceedings of the 23rd International Conference on Geoinformatics, 2015

2010

A scalable quantitative measure of IR-drop effects for scan pattern generation.

Meng-Fan Wu, Kun-Han Tsai, Wu-Tung Cheng, Hsin-Cheih Pan, Jiun-Lang Huang, Augusli Kifli

Proceedings of the 2010 International Conference on Computer-Aided Design, 2010

Power Supply Noise Reduction in Broadcast-Based Compression Environment for At-speed Scan Testing.

Chun-Yong Liang, Meng-Fan Wu, Jiun-Lang Huang

Proceedings of the 19th IEEE Asian Test Symposium, 2010

Improved weight assignment for logic switching activity during at-speed test pattern generation.

Meng-Fan Wu, Hsin-Cheih Pan, Teng-Han Wang, Jiun-Lang Huang, Kun-Han Tsai, Wu-Tung Cheng

Proceedings of the 15th Asia South Pacific Design Automation Conference, 2010

2009

Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment.

Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

LPTest: a Flexible Low-Power Test Pattern Generator.

Meng-Fan Wu, Kai-Shun Hu, Jiun-Lang Huang

J. Electron. Test., 2009

2008

Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing.

Meng-Fan Wu, Jiun-Lang Huang, Xiaoqing Wen, Kohei Miyase

Proceedings of the 2008 IEEE International Test Conference, 2008

PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for At-Speed Scan Testing in Huffman Coding Test Compression Environment.

Yi-Tsung Lin, Meng-Fan Wu, Jiun-Lang Huang

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

An Efficient Peak Power Reduction Technique for Scan Testing.

Meng-Fan Wu, Kai-Shun Hu, Jiun-Lang Huang

Proceedings of the 16th Asian Test Symposium, 2007